Perspectives of development of X-ray analysis for material composition
Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence an...
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| Veröffentlicht in: | Functional Materials |
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| Datum: | 2016 |
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | Englisch |
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НТК «Інститут монокристалів» НАН України
2016
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119712 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862725684903804928 |
|---|---|
| author | Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. |
| author_facet | Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. |
| citation_txt | Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ. |
| collection | DSpace DC |
| container_title | Functional Materials |
| description | Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.).
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| first_indexed | 2025-12-07T18:54:02Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-119712 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1027-5495 |
| language | English |
| last_indexed | 2025-12-07T18:54:02Z |
| publishDate | 2016 |
| publisher | НТК «Інститут монокристалів» НАН України |
| record_format | dspace |
| spelling | Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. 2017-06-08T07:32:50Z 2017-06-08T07:32:50Z 2016 Perspectives of development of X-ray analysis for material composition / I.F. Mikhailov, A.A. Baturin, A.I. Mikhailov, L.P. Fomina // Functional Materials. — 2016. — Т. 23, № 1. — С. 5-14. — Бібліогр.: 14 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm23.01.005 https://nasplib.isofts.kiev.ua/handle/123456789/119712 Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.). en НТК «Інститут монокристалів» НАН України Functional Materials Characterization and properties Perspectives of development of X-ray analysis for material composition Article published earlier |
| spellingShingle | Perspectives of development of X-ray analysis for material composition Mikhailov, I.F. Baturin, A.A. Mikhailov, A.I. Fomina, L.P. Characterization and properties |
| title | Perspectives of development of X-ray analysis for material composition |
| title_full | Perspectives of development of X-ray analysis for material composition |
| title_fullStr | Perspectives of development of X-ray analysis for material composition |
| title_full_unstemmed | Perspectives of development of X-ray analysis for material composition |
| title_short | Perspectives of development of X-ray analysis for material composition |
| title_sort | perspectives of development of x-ray analysis for material composition |
| topic | Characterization and properties |
| topic_facet | Characterization and properties |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/119712 |
| work_keys_str_mv | AT mikhailovif perspectivesofdevelopmentofxrayanalysisformaterialcomposition AT baturinaa perspectivesofdevelopmentofxrayanalysisformaterialcomposition AT mikhailovai perspectivesofdevelopmentofxrayanalysisformaterialcomposition AT fominalp perspectivesofdevelopmentofxrayanalysisformaterialcomposition |