The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Date: | 1999 |
| Main Authors: | , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
1999
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/119866 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862532947630882816 |
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| author | Lozovski, V. Bozhevolnyi, S. |
| author_facet | Lozovski, V. Bozhevolnyi, S. |
| citation_txt | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for solving the self-consistent integral equation. The method developed is applied to calculations of near-field optical images obtained in illumination mode. It is assumed that the system under consideration consists of an object illuminated by the field scattered by a small probe. This assumption allows us to consider multiple scattering between a (point-like) probe and an extended object as well as inside the object. The exact solution for the self-consistent field is then obtained in terms of effective susceptibility of the probe-object system. Application of our method to the description of orientation of molecular complexes at the surface is discussed.
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| first_indexed | 2025-11-24T06:15:44Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-119866 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-24T06:15:44Z |
| publishDate | 1999 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Lozovski, V. Bozhevolnyi, S. 2017-06-10T08:02:35Z 2017-06-10T08:02:35Z 1999 The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ. 1560-8034 PACS: 42.65.K https://nasplib.isofts.kiev.ua/handle/123456789/119866 The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for solving the self-consistent integral equation. The method developed is applied to calculations of near-field optical images obtained in illumination mode. It is assumed that the system under consideration consists of an object illuminated by the field scattered by a small probe. This assumption allows us to consider multiple scattering between a (point-like) probe and an extended object as well as inside the object. The exact solution for the self-consistent field is then obtained in terms of effective susceptibility of the probe-object system. Application of our method to the description of orientation of molecular complexes at the surface is discussed. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics The exact solution of self-consistent equations in the scanning near-field optic microscopy problem Article published earlier |
| spellingShingle | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem Lozovski, V. Bozhevolnyi, S. |
| title | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_full | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_fullStr | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_full_unstemmed | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_short | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_sort | exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/119866 |
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