The exact solution of self-consistent equations in the scanning near-field optic microscopy problem

The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for...

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Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:1999
Автори: Lozovski, V., Bozhevolnyi, S.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/119866
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-119866
record_format dspace
spelling Lozovski, V.
Bozhevolnyi, S.
2017-06-10T08:02:35Z
2017-06-10T08:02:35Z
1999
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ.
1560-8034
PACS: 42.65.K
https://nasplib.isofts.kiev.ua/handle/123456789/119866
The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for solving the self-consistent integral equation. The method developed is applied to calculations of near-field optical images obtained in illumination mode. It is assumed that the system under consideration consists of an object illuminated by the field scattered by a small probe. This assumption allows us to consider multiple scattering between a (point-like) probe and an extended object as well as inside the object. The exact solution for the self-consistent field is then obtained in terms of effective susceptibility of the probe-object system. Application of our method to the description of orientation of molecular complexes at the surface is discussed.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
spellingShingle The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
Lozovski, V.
Bozhevolnyi, S.
title_short The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
title_full The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
title_fullStr The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
title_full_unstemmed The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
title_sort exact solution of self-consistent equations in the scanning near-field optic microscopy problem
author Lozovski, V.
Bozhevolnyi, S.
author_facet Lozovski, V.
Bozhevolnyi, S.
publishDate 1999
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for solving the self-consistent integral equation. The method developed is applied to calculations of near-field optical images obtained in illumination mode. It is assumed that the system under consideration consists of an object illuminated by the field scattered by a small probe. This assumption allows us to consider multiple scattering between a (point-like) probe and an extended object as well as inside the object. The exact solution for the self-consistent field is then obtained in terms of effective susceptibility of the probe-object system. Application of our method to the description of orientation of molecular complexes at the surface is discussed.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/119866
fulltext
citation_txt The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ.
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