Mathematical model of photoacoustic microscopy with piezoelectric detection

Mathematical model is formulated for piezoelectric detection of the photoacoustics effect in optically semitransparent and thermally thick object with subsurface non-homogeneity in the case of free holding a piezodetector in a photoacoustic cell of the respective microscope. The model enables to est...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Datum:1999
Hauptverfasser: Vertsanova, E.V., Yakimenko, Yu.I.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Schriftenreihe:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/119867
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Mathematical model of photoacoustic microscopy with piezoelectric detection / E.V. Vertsanova, Yu.I. Yakimenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 41-44. — Бібліогр.: 6 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine
Beschreibung
Zusammenfassung:Mathematical model is formulated for piezoelectric detection of the photoacoustics effect in optically semitransparent and thermally thick object with subsurface non-homogeneity in the case of free holding a piezodetector in a photoacoustic cell of the respective microscope. The model enables to estimate the influence of subsurface defects on the photoacoustical signal and to take into account the contribution of this factor into output signal of investigated objects.