APA (7th ed.) Citation

Melnik, V., Popov, V., Kruger, D., & Oberemok, O. (1999). AES and XPS characterization of TiN layers formed and modified by ion implantation. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Melnik, V., V. Popov, D. Kruger, and O. Oberemok. "AES and XPS Characterization of TiN Layers Formed and Modified by Ion Implantation." Semiconductor Physics Quantum Electronics & Optoelectronics 1999.

MLA (8th ed.) Citation

Melnik, V., et al. "AES and XPS Characterization of TiN Layers Formed and Modified by Ion Implantation." Semiconductor Physics Quantum Electronics & Optoelectronics, 1999.

Warning: These citations may not always be 100% accurate.