Size dependence of magnetic characteristics measured on separate nickel particles
Interference electron microscopy was applied to measure the coercive force, the magnetic saturation and the residual magnetization of separated nickel particles. Nickel particles with perfect sphericity and radius from 10 to 100 nm were produced directly in the interference electron microscope by me...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 1999 |
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
1999
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119880 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Size dependence of magnetic characteristics measured on separate nickel particles / S.A. Nepijko, R. Wiesendanger // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 5-9. — Бібліогр.: 24 назв. — англ. |