Optical properties of thin metal films
Optical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr were determined on the basis of measured index of refraction in region of wavelength λ = 241216 Å. Two types of relations were used for the calculation. Some of them were obtained, with tak...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Datum: | 1999 |
| ISSN: | 1560-8034 |
| 1. Verfasser: | |
| Format: | Artikel |
| Sprache: | Englisch |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
1999
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/119882 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Optical properties of thin metal films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 13-20. — Бібліогр.: 25 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862739167590481920 |
|---|---|
| author | Kovalenko, S.A. |
| author_facet | Kovalenko, S.A. |
| citation_txt | Optical properties of thin metal films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 13-20. — Бібліогр.: 25 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Optical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr were determined on the basis of measured index of refraction in region of wavelength λ = 241216 Å. Two types of relations were used for the calculation. Some of them were obtained, with taking into account that refractive index of absorbing medium can be presented in the form ñ = n ± iæ. Other were obtained from Maxwell boundary condition. Both approaches give rise to very close results for æ, however the dependences n = f(λ) for λ > 200 Å are essentially different. The reasons of such differences are discussed.
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| first_indexed | 2025-12-07T20:08:00Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-119882 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T20:08:00Z |
| publishDate | 1999 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Kovalenko, S.A. 2017-06-10T08:12:12Z 2017-06-10T08:12:12Z 1999 Optical properties of thin metal films / S.A. Kovalenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 13-20. — Бібліогр.: 25 назв. — англ. 1560-8034 PACS: 78.66; 78.20.C https://nasplib.isofts.kiev.ua/handle/123456789/119882 Optical constants of metallic thin films made from: Ag, Au, Hf, Ir, Mo, Nb, Os, Pd, Pt, Re, Rh, Ru, Ta, W, Zr were determined on the basis of measured index of refraction in region of wavelength λ = 241216 Å. Two types of relations were used for the calculation. Some of them were obtained, with taking into account that refractive index of absorbing medium can be presented in the form ñ = n ± iæ. Other were obtained from Maxwell boundary condition. Both approaches give rise to very close results for æ, however the dependences n = f(λ) for λ > 200 Å are essentially different. The reasons of such differences are discussed. The author would like to emphasize his gratitude to Academician M.P. Lisitsa who is the supervisor and the author of the main idea of this work. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optical properties of thin metal films Article published earlier |
| spellingShingle | Optical properties of thin metal films Kovalenko, S.A. |
| title | Optical properties of thin metal films |
| title_full | Optical properties of thin metal films |
| title_fullStr | Optical properties of thin metal films |
| title_full_unstemmed | Optical properties of thin metal films |
| title_short | Optical properties of thin metal films |
| title_sort | optical properties of thin metal films |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/119882 |
| work_keys_str_mv | AT kovalenkosa opticalpropertiesofthinmetalfilms |