Local atomic structures in Si₁₋xGex and Si₁₋xSnx random solid solutions

Using molecular-dynamics method based on three-particle Tersoff’s potential simulation we have studied the Si₁₋xGex and Si₁₋xSnx random solid solutions. Bond lengths and strain energies of these alloys can be predicted. The calculated results are compared with those obtained from other theoretical...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2005
Main Authors: Deibuk, V.G., Korolyuk, Yu.G.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2005
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/119915
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Local atomic structures in Si₁₋xGex and Si₁₋xSnx random solid solutions / V.G. Deibuk,Yu.G. Korolyuk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 1. — С. 1-5. — Бібліогр.: 20 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:Using molecular-dynamics method based on three-particle Tersoff’s potential simulation we have studied the Si₁₋xGex and Si₁₋xSnx random solid solutions. Bond lengths and strain energies of these alloys can be predicted. The calculated results are compared with those obtained from other theoretical calculations and experimental measurements.
ISSN:1560-8034