APA (7th ed.) Citation

Rozouvan, T., Poperenko, L., & Shaykevich, I. (2015). Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Rozouvan, T.S, L.V Poperenko, and I.A Shaykevich. "Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique." Semiconductor Physics Quantum Electronics & Optoelectronics 2015.

MLA (8th ed.) Citation

Rozouvan, T.S, et al. "Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique." Semiconductor Physics Quantum Electronics & Optoelectronics, 2015.

Warning: These citations may not always be 100% accurate.