Rozouvan, T., Poperenko, L., & Shaykevich, I. (2015). Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Rozouvan, T.S, L.V Poperenko, und I.A Shaykevich. "Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique." Semiconductor Physics Quantum Electronics & Optoelectronics 2015.
MLA-Zitierstil (8. Ausg.)Rozouvan, T.S, et al. "Influence of the Surface Roughness and Oxide Surface Layer onto Si Optical Constants Measured by the Ellipsometry Technique." Semiconductor Physics Quantum Electronics & Optoelectronics, 2015.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.