Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by Neutron Reflectometry

• Published in: Condensed Matter Physics
• Date: 2012
• Main Authors: Jahromi, S.S., Masoudi, S.F.
• Format: Article
• Language: English
• Published: Інститут фізики конденсованих систем НАН України 2012
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/120155
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by Neutron Reflectometry / S.S. Jahromi, S.F. Masoudi // Condensed Matter Physics. — 2012. — Т. 15, № 1. — С. 13604: 1-10. — Бібліогр.: 12 назв. — англ.

Most of the reflectometry methods which are used for determining the phase of complex reflection coefficient such as Reference Method and Variation of Surroundings medium are based on solving the Schrödinger equation using a discontinuous and step-like scattering optical potential. However, during t...