Buchumschlag

Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by Neutron Reflectometry

Most of the reflectometry methods which are used for determining the phase of complex reflection coefficient such as Reference Method and Variation of Surroundings medium are based on solving the Schrödinger equation using a discontinuous and step-like scattering optical potential. However, during t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Condensed Matter Physics
Datum:2012
Hauptverfasser: Jahromi, S.S., Masoudi, S.F.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики конденсованих систем НАН України 2012
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/120155
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Investigating the effects of smoothness of interfaces on stability of probing nano-scale thin films by Neutron Reflectometry / S.S. Jahromi, S.F. Masoudi // Condensed Matter Physics. — 2012. — Т. 15, № 1. — С. 13604: 1-10. — Бібліогр.: 12 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine

Ähnliche Einträge

Ähnliche Einträge