Microwave properties of HTS films: measurements in millimeter wave range

• Опубліковано в: : Физика низких температур
• Дата: 2006
• Автори: Cherpak, N.T., Barannik, A.A., Prokopenko, Yu.V., Filipov, Yu.F., Vitusevich, S.A.
• Формат: Стаття
• Мова: Англійська
• Опубліковано: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
• Теми: Experimental Methods and Applications
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/120207
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: Microwave properties of HTS films: measurements
 in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ.

A theoretical and experimental justification of an approach proposed and developed by us for
 surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic
 properties of quasi-optical dielectric resonators with conducting endplates, which provides
 a theoretical background for studies of HTS films in the millimeter wave range, is performed.
 With this technique, the highest quality modes, namely whispering gallery modes, are excited in a
 dielectric cylindrical disc sandwiched between HTS films. Considerable enhancement of the sensitivity
 of surface resistance measurements in the millimeter wave range is demonstrated, which is
 important for the fundamental investigation of superconductor physics. It is also shown that the
 measured frequency shift in the resonator with the HTS endplates as a function of the temperature
 reveals a possibility for accurate evaluation of the field penetration depth in HTS films.