Microwave properties of HTS films: measurements in millimeter wave range
A theoretical and experimental justification of an approach proposed and developed by us for
 surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic
 properties of quasi-optical dielectric resonators with conducting endplates, which prov...
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| Veröffentlicht in: | Физика низких температур |
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| Datum: | 2006 |
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| Format: | Artikel |
| Sprache: | Englisch |
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Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2006
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/120207 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Microwave properties of HTS films: measurements
 in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862712582898450432 |
|---|---|
| author | Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. |
| author_facet | Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. |
| citation_txt | Microwave properties of HTS films: measurements
 in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ. |
| collection | DSpace DC |
| container_title | Физика низких температур |
| description | A theoretical and experimental justification of an approach proposed and developed by us for
surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic
properties of quasi-optical dielectric resonators with conducting endplates, which provides
a theoretical background for studies of HTS films in the millimeter wave range, is performed.
With this technique, the highest quality modes, namely whispering gallery modes, are excited in a
dielectric cylindrical disc sandwiched between HTS films. Considerable enhancement of the sensitivity
of surface resistance measurements in the millimeter wave range is demonstrated, which is
important for the fundamental investigation of superconductor physics. It is also shown that the
measured frequency shift in the resonator with the HTS endplates as a function of the temperature
reveals a possibility for accurate evaluation of the field penetration depth in HTS films.
|
| first_indexed | 2025-12-07T17:38:35Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-120207 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 0132-6414 |
| language | English |
| last_indexed | 2025-12-07T17:38:35Z |
| publishDate | 2006 |
| publisher | Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України |
| record_format | dspace |
| spelling | Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. 2017-06-11T12:45:07Z 2017-06-11T12:45:07Z 2006 Microwave properties of HTS films: measurements
 in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ. 0132-6414 PACS: 74.25.Nf, 74.78.Bz, 84.40.Dc, 07.57.–c https://nasplib.isofts.kiev.ua/handle/123456789/120207 A theoretical and experimental justification of an approach proposed and developed by us for
 surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic
 properties of quasi-optical dielectric resonators with conducting endplates, which provides
 a theoretical background for studies of HTS films in the millimeter wave range, is performed.
 With this technique, the highest quality modes, namely whispering gallery modes, are excited in a
 dielectric cylindrical disc sandwiched between HTS films. Considerable enhancement of the sensitivity
 of surface resistance measurements in the millimeter wave range is demonstrated, which is
 important for the fundamental investigation of superconductor physics. It is also shown that the
 measured frequency shift in the resonator with the HTS endplates as a function of the temperature
 reveals a possibility for accurate evaluation of the field penetration depth in HTS films. en Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України Физика низких температур Experimental Methods and Applications Microwave properties of HTS films: measurements in millimeter wave range Article published earlier |
| spellingShingle | Microwave properties of HTS films: measurements in millimeter wave range Cherpak, N.T. Barannik, A.A. Prokopenko, Yu.V. Filipov, Yu.F. Vitusevich, S.A. Experimental Methods and Applications |
| title | Microwave properties of HTS films: measurements in millimeter wave range |
| title_full | Microwave properties of HTS films: measurements in millimeter wave range |
| title_fullStr | Microwave properties of HTS films: measurements in millimeter wave range |
| title_full_unstemmed | Microwave properties of HTS films: measurements in millimeter wave range |
| title_short | Microwave properties of HTS films: measurements in millimeter wave range |
| title_sort | microwave properties of hts films: measurements in millimeter wave range |
| topic | Experimental Methods and Applications |
| topic_facet | Experimental Methods and Applications |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/120207 |
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