Cover Image

Microwave properties of HTS films: measurements in millimeter wave range

A theoretical and experimental justification of an approach proposed and developed by us for
 surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic
 properties of quasi-optical dielectric resonators with conducting endplates, which prov...

Full description

Saved in:
Bibliographic Details
Published in:Физика низких температур
Date:2006
ISSN:0132-6414
Main Authors: Cherpak, N.T., Barannik, A.A., Prokopenko, Yu.V., Filipov, Yu.F., Vitusevich, S.A.
Format: Article
Language:English
Published: Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
Subjects:
Experimental Methods and Applications
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/120207
Tags: Add Tag
No Tags, Be the first to tag this record!
Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Microwave properties of HTS films: measurements
 in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine

Similar Items

Similar Items