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Microwave properties of HTS films: measurements in millimeter wave range

A theoretical and experimental justification of an approach proposed and developed by us for surface impedance standard measurements of HTS films is presented. An analysis of the electromagnetic properties of quasi-optical dielectric resonators with conducting endplates, which prov...

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Veröffentlicht in:	Физика низких температур
Datum:	2006
Hauptverfasser:	Cherpak, N.T., Barannik, A.A., Prokopenko, Yu.V., Filipov, Yu.F., Vitusevich, S.A.
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України 2006
Schlagworte:	Experimental Methods and Applications
Online Zugang:	https://nasplib.isofts.kiev.ua/handle/123456789/120207
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:	Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:	Microwave properties of HTS films: measurements in millimeter wave range / N.T. Cherpak, A.A. Barannik, Yu.V. Prokopenko, Yu.F. Filipov, S.A. Vitusevich // Физика низких температур. — 2006. — Т. 32, № 6. — С. 795–801. — Бібліогр.: 21 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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