Residual error after non-uniformity correction
The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array.
Збережено в:
| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2000 |
| Автор: | |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2000
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/120229 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Residual error after non-uniformity correction / V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 1. — С. 102-105. — Бібліогр.: 4 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862554606898249728 |
|---|---|
| author | Borovytsky, V.N. |
| author_facet | Borovytsky, V.N. |
| citation_txt | Residual error after non-uniformity correction / V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 1. — С. 102-105. — Бібліогр.: 4 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array.
|
| first_indexed | 2025-11-25T21:44:33Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-120229 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-25T21:44:33Z |
| publishDate | 2000 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Borovytsky, V.N. 2017-06-11T13:14:06Z 2017-06-11T13:14:06Z 2000 Residual error after non-uniformity correction / V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 1. — С. 102-105. — Бібліогр.: 4 назв. — англ. 1560-8034 PACS 07.07.D,42.79.P,Q https://nasplib.isofts.kiev.ua/handle/123456789/120229 The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Residual error after non-uniformity correction Article published earlier |
| spellingShingle | Residual error after non-uniformity correction Borovytsky, V.N. |
| title | Residual error after non-uniformity correction |
| title_full | Residual error after non-uniformity correction |
| title_fullStr | Residual error after non-uniformity correction |
| title_full_unstemmed | Residual error after non-uniformity correction |
| title_short | Residual error after non-uniformity correction |
| title_sort | residual error after non-uniformity correction |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/120229 |
| work_keys_str_mv | AT borovytskyvn residualerrorafternonuniformitycorrection |