Residual error after non-uniformity correction

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 2000
• Main Author: Borovytsky, V.N.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2000
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/120229
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Residual error after non-uniformity correction / V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 1. — С. 102-105. — Бібліогр.: 4 назв. — англ.

The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array.