Buchumschlag

Residual error after non-uniformity correction

The paper represents the technique for residual error evaluation after two-points linear non-uniformity correction. This technique takes into consideration parameters of an imaging system, reference sources, non-linearity and noise of a focal plane array.

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Bibliographische Detailangaben
Veröffentlicht in:	Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:	2000
1. Verfasser:	Borovytsky, V.N.
Format:	Artikel
Sprache:	Englisch
Veröffentlicht:	Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2000
Online Zugang:	https://nasplib.isofts.kiev.ua/handle/123456789/120229
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:	Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:	Residual error after non-uniformity correction / V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 1. — С. 102-105. — Бібліогр.: 4 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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