Evaluation of the efficiency of interband radiative recombination in high quality Si

It is shown theoretically that quantum efficiency of interband radiation in highly purified silicon with low concentration of deep impurities and defects can exceed 10% at room temperatures in the case of negligibly small surface recombination. Dependencies of quantum efficiency on intensity and wav...

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:1999
Main Authors: Sachenko, A.V., Kryuchenko, Yu.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/120242
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Evaluation of the efficiency of interband radiative recombination in high quality Si / A.V. Sachenko, Yu.V. Kryuchenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 55-60. — Бібліогр.: 17 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Sachenko, A.V.
Kryuchenko, Yu.V.
author_facet Sachenko, A.V.
Kryuchenko, Yu.V.
citation_txt Evaluation of the efficiency of interband radiative recombination in high quality Si / A.V. Sachenko, Yu.V. Kryuchenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 55-60. — Бібліогр.: 17 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description It is shown theoretically that quantum efficiency of interband radiation in highly purified silicon with low concentration of deep impurities and defects can exceed 10% at room temperatures in the case of negligibly small surface recombination. Dependencies of quantum efficiency on intensity and wavelength of exciting monochromatic light, surface recombination rate and thickness of silicon plate are discussed.
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institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
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language English
last_indexed 2025-12-07T20:54:05Z
publishDate 1999
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Sachenko, A.V.
Kryuchenko, Yu.V.
2017-06-11T13:39:42Z
2017-06-11T13:39:42Z
1999
Evaluation of the efficiency of interband radiative recombination in high quality Si / A.V. Sachenko, Yu.V. Kryuchenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 55-60. — Бібліогр.: 17 назв. — англ.
1560-8034
PACS 72.20.J, 78.55, 78.60
https://nasplib.isofts.kiev.ua/handle/123456789/120242
It is shown theoretically that quantum efficiency of interband radiation in highly purified silicon with low concentration of deep impurities and defects can exceed 10% at room temperatures in the case of negligibly small surface recombination. Dependencies of quantum efficiency on intensity and wavelength of exciting monochromatic light, surface recombination rate and thickness of silicon plate are discussed.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Evaluation of the efficiency of interband radiative recombination in high quality Si
Article
published earlier
spellingShingle Evaluation of the efficiency of interband radiative recombination in high quality Si
Sachenko, A.V.
Kryuchenko, Yu.V.
title Evaluation of the efficiency of interband radiative recombination in high quality Si
title_full Evaluation of the efficiency of interband radiative recombination in high quality Si
title_fullStr Evaluation of the efficiency of interband radiative recombination in high quality Si
title_full_unstemmed Evaluation of the efficiency of interband radiative recombination in high quality Si
title_short Evaluation of the efficiency of interband radiative recombination in high quality Si
title_sort evaluation of the efficiency of interband radiative recombination in high quality si
url https://nasplib.isofts.kiev.ua/handle/123456789/120242
work_keys_str_mv AT sachenkoav evaluationoftheefficiencyofinterbandradiativerecombinationinhighqualitysi
AT kryuchenkoyuv evaluationoftheefficiencyofinterbandradiativerecombinationinhighqualitysi