Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study
A multiple angle ellipsometric method is used for measurements of thin film layers on substrates. The method evaluates fundamental optical constants and thicknesses of the film layers. Dielectric functions of the surface layers on the gadolinium gallium garnet (GdGaG) substrate – commonly used subst...
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| Published in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
|---|---|
| Date: | 1999 |
| Main Authors: | , , , |
| Format: | Article |
| Language: | English |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
1999
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/120246 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study / A.I. Belyaeva, A.A. Galuza, T.G. Grebennik, V.P. Yuriyev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 61-65. — Бібліогр.: 5 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862643798782246912 |
|---|---|
| author | Belyaeva, A.I. Galuza, A.A. Grebennik, T.G. Yuriyev, V.P. |
| author_facet | Belyaeva, A.I. Galuza, A.A. Grebennik, T.G. Yuriyev, V.P. |
| citation_txt | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study / A.I. Belyaeva, A.A. Galuza, T.G. Grebennik, V.P. Yuriyev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 61-65. — Бібліогр.: 5 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | A multiple angle ellipsometric method is used for measurements of thin film layers on substrates. The method evaluates fundamental optical constants and thicknesses of the film layers. Dielectric functions of the surface layers on the gadolinium gallium garnet (GdGaG) substrate – commonly used substrate material for rare-earth ferrogarnets (ReFeG) films, have been determined. The thickness and origin of the surface layer on the GdGaG substrate was found out. It is shown that the dielectric properties of microscopically rough layers with thicknesses ~ of 20 to 35 nm can be accurately modeled in the homogeneous thin layer approximation, but not in the effective-medium one. The precision of data was confirmed by comparing different simulations. Agreement to the third decimal point for refraction index was shown. Errors for thicknesses were not more than 3%.
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| first_indexed | 2025-12-01T08:13:01Z |
| format | Article |
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| id | nasplib_isofts_kiev_ua-123456789-120246 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-01T08:13:01Z |
| publishDate | 1999 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Belyaeva, A.I. Galuza, A.A. Grebennik, T.G. Yuriyev, V.P. 2017-06-11T13:48:35Z 2017-06-11T13:48:35Z 1999 Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study / A.I. Belyaeva, A.A. Galuza, T.G. Grebennik, V.P. Yuriyev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 61-65. — Бібліогр.: 5 назв. — англ. 1560-8034 PACS: 78.20.C, 78.66 https://nasplib.isofts.kiev.ua/handle/123456789/120246 A multiple angle ellipsometric method is used for measurements of thin film layers on substrates. The method evaluates fundamental optical constants and thicknesses of the film layers. Dielectric functions of the surface layers on the gadolinium gallium garnet (GdGaG) substrate – commonly used substrate material for rare-earth ferrogarnets (ReFeG) films, have been determined. The thickness and origin of the surface layer on the GdGaG substrate was found out. It is shown that the dielectric properties of microscopically rough layers with thicknesses ~ of 20 to 35 nm can be accurately modeled in the homogeneous thin layer approximation, but not in the effective-medium one. The precision of data was confirmed by comparing different simulations. Agreement to the third decimal point for refraction index was shown. Errors for thicknesses were not more than 3%. This work is supported by International Science Foundation (Grant N QSU082009). en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study Article published earlier |
| spellingShingle | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study Belyaeva, A.I. Galuza, A.A. Grebennik, T.G. Yuriyev, V.P. |
| title | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study |
| title_full | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study |
| title_fullStr | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study |
| title_full_unstemmed | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study |
| title_short | Optical constants of surface layer on gadolinium gallium garnet: ellipsometric study |
| title_sort | optical constants of surface layer on gadolinium gallium garnet: ellipsometric study |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/120246 |
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