Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes

The results of electrical, Hall effect and optical absorption studies of Hg₁₋xMnxTe (x >> 0.1–0.2) single crystals in the temperature range 80 to 300 K are reported. The observed dependences of the Hall coefficient inversion temperature on the acceptor concentration and semiconductor bandgap a...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:1999
Hauptverfasser: Kosyachenko, L.A., Rarenko, I.M., Bodnaruk, O.O., Frasunyak, V.M., Sklyarchuk, V.M., Sklyarchuk, Ye.F., Sun Weiguo, Lu Zheng Xiong
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/120253
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes / L.A. Kosyachenko, I.M. Rarenko, O.O. Bodnaruk, V.M. Frasunyak, V.M. Sklyarchuk, Ye.F. Sklyarchuk, Sun Weiguo, Lu Zheng Xiong // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 31-36. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-120253
record_format dspace
spelling Kosyachenko, L.A.
Rarenko, I.M.
Bodnaruk, O.O.
Frasunyak, V.M.
Sklyarchuk, V.M.
Sklyarchuk, Ye.F.
Sun Weiguo
Lu Zheng Xiong
2017-06-11T14:06:34Z
2017-06-11T14:06:34Z
1999
Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes / L.A. Kosyachenko, I.M. Rarenko, O.O. Bodnaruk, V.M. Frasunyak, V.M. Sklyarchuk, Ye.F. Sklyarchuk, Sun Weiguo, Lu Zheng Xiong // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 31-36. — Бібліогр.: 14 назв. — англ.
1560-8034
PACS: 71.28, 72.20.J, 78.40.F, 78.66
https://nasplib.isofts.kiev.ua/handle/123456789/120253
The results of electrical, Hall effect and optical absorption studies of Hg₁₋xMnxTe (x >> 0.1–0.2) single crystals in the temperature range 80 to 300 K are reported. The observed dependences of the Hall coefficient inversion temperature on the acceptor concentration and semiconductor bandgap are supported by calculations. The long-wavelength absorption edge is treated using the Kane model. The revealed features of the absorption are considered to be caused by small effective mass of electrons in the narrow-gap semiconductors studied. The diodes with p-n junctions produced by ion etching have good rectifying properties determined by carrier generation-recombination, tunneling and avalanche processes.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes
spellingShingle Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes
Kosyachenko, L.A.
Rarenko, I.M.
Bodnaruk, O.O.
Frasunyak, V.M.
Sklyarchuk, V.M.
Sklyarchuk, Ye.F.
Sun Weiguo
Lu Zheng Xiong
title_short Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes
title_full Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes
title_fullStr Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes
title_full_unstemmed Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes
title_sort characterization of hg₁₋xmnxte single crystals and hg₁₋xmnxte -based photodiodes
author Kosyachenko, L.A.
Rarenko, I.M.
Bodnaruk, O.O.
Frasunyak, V.M.
Sklyarchuk, V.M.
Sklyarchuk, Ye.F.
Sun Weiguo
Lu Zheng Xiong
author_facet Kosyachenko, L.A.
Rarenko, I.M.
Bodnaruk, O.O.
Frasunyak, V.M.
Sklyarchuk, V.M.
Sklyarchuk, Ye.F.
Sun Weiguo
Lu Zheng Xiong
publishDate 1999
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The results of electrical, Hall effect and optical absorption studies of Hg₁₋xMnxTe (x >> 0.1–0.2) single crystals in the temperature range 80 to 300 K are reported. The observed dependences of the Hall coefficient inversion temperature on the acceptor concentration and semiconductor bandgap are supported by calculations. The long-wavelength absorption edge is treated using the Kane model. The revealed features of the absorption are considered to be caused by small effective mass of electrons in the narrow-gap semiconductors studied. The diodes with p-n junctions produced by ion etching have good rectifying properties determined by carrier generation-recombination, tunneling and avalanche processes.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/120253
citation_txt Characterization of Hg₁₋xMnxTe single crystals and Hg₁₋xMnxTe -based photodiodes / L.A. Kosyachenko, I.M. Rarenko, O.O. Bodnaruk, V.M. Frasunyak, V.M. Sklyarchuk, Ye.F. Sklyarchuk, Sun Weiguo, Lu Zheng Xiong // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 4. — С. 31-36. — Бібліогр.: 14 назв. — англ.
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