The structure, phase and chemical composition of CZTSe thin films
Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly...
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| Опубліковано в: : | Functional Materials |
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| Дата: | 2014 |
| Автори: | , , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
НТК «Інститут монокристалів» НАН України
2014
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| Теми: | |
| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/120411 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly CZTSe compound, which has a tetragonal kesterite lattice type. The samples have textural growth of [211]. The lattice parameters of the material varied in the range of a = (0.56640-0.56867) nm, c = (1.13466-1.13776) nm, c/2a = 0.9983-1.0017 which correlate well with the reference data in a stable phase CZTSe compounds. From our PIXE analyses we assessed the influence of the growth conditions on the samples chemical composition and mapped the surface distribution.
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| ISSN: | 1027-5495 |