The structure, phase and chemical composition of CZTSe thin films

Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly...

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Published in:Functional Materials
Date:2014
Main Authors: Opanasyuk, A.S., Koval, P.V., Nam, D., Cheong, H., Jeong, A.R., Jo, W., Ponomarev, A.G.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2014
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/120411
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-120411
record_format dspace
spelling Opanasyuk, A.S.
Koval, P.V.
Nam, D.
Cheong, H.
Jeong, A.R.
Jo, W.
Ponomarev, A.G.
2017-06-12T07:29:26Z
2017-06-12T07:29:26Z
2014
The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ.
1027-5495
DOI: dx.doi.org/10.15407/fm21.02.164
https://nasplib.isofts.kiev.ua/handle/123456789/120411
Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly CZTSe compound, which has a tetragonal kesterite lattice type. The samples have textural growth of [211]. The lattice parameters of the material varied in the range of a = (0.56640-0.56867) nm, c = (1.13466-1.13776) nm, c/2a = 0.9983-1.0017 which correlate well with the reference data in a stable phase CZTSe compounds. From our PIXE analyses we assessed the influence of the growth conditions on the samples chemical composition and mapped the surface distribution.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
Characterization and properties
The structure, phase and chemical composition of CZTSe thin films
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title The structure, phase and chemical composition of CZTSe thin films
spellingShingle The structure, phase and chemical composition of CZTSe thin films
Opanasyuk, A.S.
Koval, P.V.
Nam, D.
Cheong, H.
Jeong, A.R.
Jo, W.
Ponomarev, A.G.
Characterization and properties
title_short The structure, phase and chemical composition of CZTSe thin films
title_full The structure, phase and chemical composition of CZTSe thin films
title_fullStr The structure, phase and chemical composition of CZTSe thin films
title_full_unstemmed The structure, phase and chemical composition of CZTSe thin films
title_sort structure, phase and chemical composition of cztse thin films
author Opanasyuk, A.S.
Koval, P.V.
Nam, D.
Cheong, H.
Jeong, A.R.
Jo, W.
Ponomarev, A.G.
author_facet Opanasyuk, A.S.
Koval, P.V.
Nam, D.
Cheong, H.
Jeong, A.R.
Jo, W.
Ponomarev, A.G.
topic Characterization and properties
topic_facet Characterization and properties
publishDate 2014
language English
container_title Functional Materials
publisher НТК «Інститут монокристалів» НАН України
format Article
description Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly CZTSe compound, which has a tetragonal kesterite lattice type. The samples have textural growth of [211]. The lattice parameters of the material varied in the range of a = (0.56640-0.56867) nm, c = (1.13466-1.13776) nm, c/2a = 0.9983-1.0017 which correlate well with the reference data in a stable phase CZTSe compounds. From our PIXE analyses we assessed the influence of the growth conditions on the samples chemical composition and mapped the surface distribution.
issn 1027-5495
url https://nasplib.isofts.kiev.ua/handle/123456789/120411
citation_txt The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ.
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first_indexed 2025-12-07T20:21:39Z
last_indexed 2025-12-07T20:21:39Z
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