The structure, phase and chemical composition of CZTSe thin films
Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly...
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| Published in: | Functional Materials |
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| Date: | 2014 |
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| Format: | Article |
| Language: | English |
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НТК «Інститут монокристалів» НАН України
2014
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/120411 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ. |
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Opanasyuk, A.S. Koval, P.V. Nam, D. Cheong, H. Jeong, A.R. Jo, W. Ponomarev, A.G. 2017-06-12T07:29:26Z 2017-06-12T07:29:26Z 2014 The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm21.02.164 https://nasplib.isofts.kiev.ua/handle/123456789/120411 Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly CZTSe compound, which has a tetragonal kesterite lattice type. The samples have textural growth of [211]. The lattice parameters of the material varied in the range of a = (0.56640-0.56867) nm, c = (1.13466-1.13776) nm, c/2a = 0.9983-1.0017 which correlate well with the reference data in a stable phase CZTSe compounds. From our PIXE analyses we assessed the influence of the growth conditions on the samples chemical composition and mapped the surface distribution. en НТК «Інститут монокристалів» НАН України Functional Materials Characterization and properties The structure, phase and chemical composition of CZTSe thin films Article published earlier |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
The structure, phase and chemical composition of CZTSe thin films |
| spellingShingle |
The structure, phase and chemical composition of CZTSe thin films Opanasyuk, A.S. Koval, P.V. Nam, D. Cheong, H. Jeong, A.R. Jo, W. Ponomarev, A.G. Characterization and properties |
| title_short |
The structure, phase and chemical composition of CZTSe thin films |
| title_full |
The structure, phase and chemical composition of CZTSe thin films |
| title_fullStr |
The structure, phase and chemical composition of CZTSe thin films |
| title_full_unstemmed |
The structure, phase and chemical composition of CZTSe thin films |
| title_sort |
structure, phase and chemical composition of cztse thin films |
| author |
Opanasyuk, A.S. Koval, P.V. Nam, D. Cheong, H. Jeong, A.R. Jo, W. Ponomarev, A.G. |
| author_facet |
Opanasyuk, A.S. Koval, P.V. Nam, D. Cheong, H. Jeong, A.R. Jo, W. Ponomarev, A.G. |
| topic |
Characterization and properties |
| topic_facet |
Characterization and properties |
| publishDate |
2014 |
| language |
English |
| container_title |
Functional Materials |
| publisher |
НТК «Інститут монокристалів» НАН України |
| format |
Article |
| description |
Cu₂ZnSnSe₄ thin films obtained by co-evaporation of components using an electron beam evaporation system were investigated by scanning electron microscopy, X-ray analysis, PIXI and RBS methods. The analysis of the diffraction patterns showed that the films are almost single-phased and contain mainly CZTSe compound, which has a tetragonal kesterite lattice type. The samples have textural growth of [211]. The lattice parameters of the material varied in the range of a = (0.56640-0.56867) nm, c = (1.13466-1.13776) nm, c/2a = 0.9983-1.0017 which correlate well with the reference data in a stable phase CZTSe compounds. From our PIXE analyses we assessed the influence of the growth conditions on the samples chemical composition and mapped the surface distribution.
|
| issn |
1027-5495 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/120411 |
| citation_txt |
The structure, phase and chemical composition of CZTSe thin films / A.S. Opanasyuk, P.V. Koval, D. Nam, H. Cheong, A.R. Jeong, W. Jo, A.G. Ponomarev // Functional Materials. — 2014. — Т. 21, № 2. — С. 164-170. — Бібліогр.: 26 назв. — англ. |
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2025-12-07T20:21:39Z |
| last_indexed |
2025-12-07T20:21:39Z |
| _version_ |
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