Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffractio...
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| Published in: | Functional Materials |
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| Date: | 2014 |
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
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НТК «Інститут монокристалів» НАН України
2014
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| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/120413 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862736236724092928 |
|---|---|
| author | Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. |
| author_facet | Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. |
| citation_txt | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. |
| collection | DSpace DC |
| container_title | Functional Materials |
| description | The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL.
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| first_indexed | 2025-12-07T19:53:04Z |
| format | Article |
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| id | nasplib_isofts_kiev_ua-123456789-120413 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1027-5495 |
| language | English |
| last_indexed | 2025-12-07T19:53:04Z |
| publishDate | 2014 |
| publisher | НТК «Інститут монокристалів» НАН України |
| record_format | dspace |
| spelling | Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. 2017-06-12T07:30:07Z 2017-06-12T07:30:07Z 2014 Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm21.02.171 https://nasplib.isofts.kiev.ua/handle/123456789/120413 The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL. en НТК «Інститут монокристалів» НАН України Functional Materials Characterization and properties Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method Article published earlier |
| spellingShingle | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. Characterization and properties |
| title | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_full | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_fullStr | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_full_unstemmed | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_short | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_sort | investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal x-ray diffraction method |
| topic | Characterization and properties |
| topic_facet | Characterization and properties |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/120413 |
| work_keys_str_mv | AT tkachenkovf investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT kryvonogovsi investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT budnikovat investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT lukienkooa investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT vovkea investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod |