Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffractio...
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| Veröffentlicht in: | Functional Materials |
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| Datum: | 2014 |
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| Sprache: | English |
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НТК «Інститут монокристалів» НАН України
2014
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| Zitieren: | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. |
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Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. 2017-06-12T07:30:07Z 2017-06-12T07:30:07Z 2014 Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm21.02.171 https://nasplib.isofts.kiev.ua/handle/123456789/120413 The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL. en НТК «Інститут монокристалів» НАН України Functional Materials Characterization and properties Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| spellingShingle |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. Characterization and properties |
| title_short |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_full |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_fullStr |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_full_unstemmed |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method |
| title_sort |
investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal x-ray diffraction method |
| author |
Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. |
| author_facet |
Tkachenko, V.F. Kryvonogov, S.I. Budnikov, A.T. Lukienko, O.A. Vovk, E.A. |
| topic |
Characterization and properties |
| topic_facet |
Characterization and properties |
| publishDate |
2014 |
| language |
English |
| container_title |
Functional Materials |
| publisher |
НТК «Інститут монокристалів» НАН України |
| format |
Article |
| description |
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffraction reflection curves made it possible to establish the structure and character of distortions in the DL. There was established the mean-square disorientation between the fragments, which allowed to characterize the defects structure of the surface-adjacent DL.
|
| issn |
1027-5495 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/120413 |
| citation_txt |
Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. |
| work_keys_str_mv |
AT tkachenkovf investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT kryvonogovsi investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT budnikovat investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT lukienkooa investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod AT vovkea investigationofdamagedlayerformedatmechanicaltreatmentofsapphireusingthreecrystalxraydiffractionmethod |
| first_indexed |
2025-12-07T19:53:04Z |
| last_indexed |
2025-12-07T19:53:04Z |
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1850880488760147968 |