Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method
The methods of three-crystal X-ray diffractometry were used for investigating structure perfection in surface-adjacent damaged layer (DL) formed in the process of mechanical and chemical-mechanical treatment of sapphire crystals with the surface orientation {0001} {11-20}. Analysis of the diffractio...
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| Published in: | Functional Materials |
|---|---|
| Date: | 2014 |
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2014
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| Subjects: | |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/120413 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Investigation of damaged layer formed at mechanical treatment of sapphire using three-crystal X-ray diffraction method / V.F. Tkachenko, S.I. Kryvonogov, A.T. Budnikov, O.A. Lukienko, E.A. Vovk // Functional Materials. — 2014. — Т. 21, № 2. — С. 171-175. — Бібліогр.: 17 назв. — англ. |