The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration

• Опубліковано в: : Functional Materials
• Дата: 2016
• Автори: Liu Kejia, Xue Yin, Chen Kun
• Формат: Стаття
• Мова: Англійська
• Опубліковано: НТК «Інститут монокристалів» НАН України 2016
• Теми: Characterization and properties
• Онлайн доступ: https://nasplib.isofts.kiev.ua/handle/123456789/120613
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Цитувати: The theory of the line profile based on the absorption of X-ray diffraction and its experimental demonstration / Liu Kejia, Xue Yin, Chen Kun // Functional Materials. — 2016. — Т. 23, № 2. — С. 212-217. — Бібліогр.: 5 назв. — англ.

We have studied the theory of the X-ray diffraction (XRD) absorption peak profile (Liu, K. et al., Adv X-ray Anal, 2010, 54, 17-23) in detail by further theoretical derivation and by verification of the experimental line profile of a standard sample. It was obtained that the deviation between theory...