New possibility of retrospective EPR dosimetry

• Veröffentlicht in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Datum: 2000
• Hauptverfasser: Vorona, I., Ishchenko, S., Okulov, S., Petrenko, T.T.
• Format: Artikel
• Sprache: Englisch
• Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2000
• Online Zugang: https://nasplib.isofts.kiev.ua/handle/123456789/121114
• Назва журналу: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Zitieren: New possibility of retrospective EPR dosimetry / I. Vorona, S. Ishchenko, S. Okulov, T.T. Petrenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 2. — С. 219-222. — Бібліогр.: 13 назв. — англ.

Tooth enamel plates irradiated by different types of radiation were studied by electron paramagnetic resonance imaging with local gradient of magnetic field. The dependence of radiation defect distributions on an irradiation type was found. A new procedure of retrospective electron paramagnetic reso...