On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior

Some peculiarities in the rapid portion of the voltage dependences of luminance and transferred charge as well as in its aging behavior in ZnS:Mn thin film electroluminescent devices made by different deposition techniques have been revealed. The devices with nearly the same Mn concentration (~1 at....

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Published in:Semiconductor Physics Quantum Electronics & Optoelectronics
Date:2002
Main Authors: Vlasenko, N.A., Denisova, Z.L., Kononets, Ya.F., Veligura, L.I., Chumachkova, M.M., Tsyrkunov, Yu.A., Soininen, E.L., Tornqvist, R.O., Vasame, K.M.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2002
Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/121128
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior / N.A. Vlasenko, Z.L. Denisova, Ya.F. Kononets, L.I. Veligura, M.M. Chumachkova, Yu.A. Tsyrkunov, E.L. Soininen, R.O. Tornqvist, K.M. Vasame // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 1. — С. 58-62. — Бібліогр.: 12 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Vlasenko, N.A.
Denisova, Z.L.
Kononets, Ya.F.
Veligura, L.I.
Chumachkova, M.M.
Tsyrkunov, Yu.A.
Soininen, E.L.
Tornqvist, R.O.
Vasame, K.M.
author_facet Vlasenko, N.A.
Denisova, Z.L.
Kononets, Ya.F.
Veligura, L.I.
Chumachkova, M.M.
Tsyrkunov, Yu.A.
Soininen, E.L.
Tornqvist, R.O.
Vasame, K.M.
citation_txt On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior / N.A. Vlasenko, Z.L. Denisova, Ya.F. Kononets, L.I. Veligura, M.M. Chumachkova, Yu.A. Tsyrkunov, E.L. Soininen, R.O. Tornqvist, K.M. Vasame // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 1. — С. 58-62. — Бібліогр.: 12 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Some peculiarities in the rapid portion of the voltage dependences of luminance and transferred charge as well as in its aging behavior in ZnS:Mn thin film electroluminescent devices made by different deposition techniques have been revealed. The devices with nearly the same Mn concentration (~1 at. %) were deposited by electron-beam evaporation and two atomic-layer epitaxy processes based on chlorine (ZnCl₂, MnCl₂) or organic (diethyl Zn and Mn(thd)₃ ) precursors. It has been studied interrelation between these peculiarities and the differences observed in the photodepolarization spectra of the devices, which give data about defects in the ZnS:Mn films and the energy of corresponding local states in them. The obtained results are discussed as to physical processes responsible for the rapid portion of the above voltage dependences and for the causes of its change after short-time accelerated aging.
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language English
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publishDate 2002
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Vlasenko, N.A.
Denisova, Z.L.
Kononets, Ya.F.
Veligura, L.I.
Chumachkova, M.M.
Tsyrkunov, Yu.A.
Soininen, E.L.
Tornqvist, R.O.
Vasame, K.M.
2017-06-13T15:28:09Z
2017-06-13T15:28:09Z
2002
On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior / N.A. Vlasenko, Z.L. Denisova, Ya.F. Kononets, L.I. Veligura, M.M. Chumachkova, Yu.A. Tsyrkunov, E.L. Soininen, R.O. Tornqvist, K.M. Vasame // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 1. — С. 58-62. — Бібліогр.: 12 назв. — англ.
1560-8034
PACS: 71.55.Gs, 78.60.Fi, 78.66.Hf
https://nasplib.isofts.kiev.ua/handle/123456789/121128
Some peculiarities in the rapid portion of the voltage dependences of luminance and transferred charge as well as in its aging behavior in ZnS:Mn thin film electroluminescent devices made by different deposition techniques have been revealed. The devices with nearly the same Mn concentration (~1 at. %) were deposited by electron-beam evaporation and two atomic-layer epitaxy processes based on chlorine (ZnCl₂, MnCl₂) or organic (diethyl Zn and Mn(thd)₃ ) precursors. It has been studied interrelation between these peculiarities and the differences observed in the photodepolarization spectra of the devices, which give data about defects in the ZnS:Mn films and the energy of corresponding local states in them. The obtained results are discussed as to physical processes responsible for the rapid portion of the above voltage dependences and for the causes of its change after short-time accelerated aging.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior
Article
published earlier
spellingShingle On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior
Vlasenko, N.A.
Denisova, Z.L.
Kononets, Ya.F.
Veligura, L.I.
Chumachkova, M.M.
Tsyrkunov, Yu.A.
Soininen, E.L.
Tornqvist, R.O.
Vasame, K.M.
title On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior
title_full On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior
title_fullStr On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior
title_full_unstemmed On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior
title_short On origin of rapid portion of luminance-voltage dependence of ZnS:Mn TFEL devices and its aging behavior
title_sort on origin of rapid portion of luminance-voltage dependence of zns:mn tfel devices and its aging behavior
url https://nasplib.isofts.kiev.ua/handle/123456789/121128
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