Melt instabilities on semiconductor surfaces induced by laser radiation

Laser modifications of semiconductors are often realized by pulsed rapid melting and subsequent resolidification. Recently melt instabilities have been discovered in locally melted semiconductor surfaces. We determined that spontaneous segregation of uniform temperature stage of crystal lattice and...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2000
Hauptverfasser: Bonchik, A.Yu., Dacko, B.J., Demchuk, V.I., Kiyak, S.G., Palyvoda, I.P., Shnyr, A.F.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2000
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121141
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Melt instabilities on semiconductor surfaces induced by laser radiation / A.Yu. Bonchik, B.J. Dacko, V.I. Demchuk, S.G. Kiyak, I.P. Palyvoda, A.F. Shnyr // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 3. — С. 311-315. — Бібліогр.: 8 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Zusammenfassung:Laser modifications of semiconductors are often realized by pulsed rapid melting and subsequent resolidification. Recently melt instabilities have been discovered in locally melted semiconductor surfaces. We determined that spontaneous segregation of uniform temperature stage of crystal lattice and charge carrier concentration can take place in electron-hole plasma, generated by laser radiation. Besides, there exists a positive feedback between the temperature of crystal lattice and charge carrier concentration in the region of their fluctuation. It causes both amplification of original fluctuation of temperature and generation of quasi-periodic temperature fields of large amplitude in semiconductors. The nonuniform temperature fields determine the features of surface relief formation in a zone of laser radiation action.
ISSN:1560-8034