Temperature studies of optical parameters in (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films

(Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films were deposited onto a silica substrate by using rapid thermal evaporation. The surfaces of the films were covered with Ag-rich crystalline micrometer-sized cones. The optical transmission spectra of thin films were studied within the temperature range 77…300 K. The...

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Збережено в:
Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2015
Автори: Studenyak, I.P., Kutsyk, M.M., Rati, Y.Y., Izai, V.Yu., Kökényesi, S., Daróci, L., Bohdan, R.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/121143
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Temperature studies of optical parameters in (Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films / I.P. Studenyak, M.M. Kutsyk, Y.Y. Rati, V.Yu. Izai, S. Kökényesi, L. Daróci, R. Bohdan // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 188-192. — Бібліогр.: 19 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:(Ag₃AsS₃)₀.₆(As₂S₃)₀.₄ thin films were deposited onto a silica substrate by using rapid thermal evaporation. The surfaces of the films were covered with Ag-rich crystalline micrometer-sized cones. The optical transmission spectra of thin films were studied within the temperature range 77…300 K. The absorption spectra in the region of its exponential behaviour were analysed, the dispersion dependences of refractive index as well as the temperature dependences of energy position of absorption edge and Urbach energy were investigated.
ISSN:1560-8034