Lysenko, V., Tyagulski, I., Gomeniuk, Y., & Osiyuk, I. (2000). Effect of the charge state of traps on the transport current in the SiC/Si heterostructure. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Lysenko, V.S, I.P Tyagulski, Y.V Gomeniuk, und I.N Osiyuk. "Effect of the Charge State of Traps on the Transport Current in the SiC/Si Heterostructure." Semiconductor Physics Quantum Electronics & Optoelectronics 2000.
MLA-Zitierstil (8. Ausg.)Lysenko, V.S, et al. "Effect of the Charge State of Traps on the Transport Current in the SiC/Si Heterostructure." Semiconductor Physics Quantum Electronics & Optoelectronics, 2000.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.