Properties and application of the unequal thickness two-component interference systems
The methods of synthesis and designing of the two-component unequal thickness multilayer interference systems as well as interconnection of their indices of layers are presented. A solution of the problem of suppressing high reflection zones at any harmonic frequency while maintaining high reflectio...
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| Date: | 2000 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2000
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| Series: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Access: | https://nasplib.isofts.kiev.ua/handle/123456789/121169 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Properties and application of the unequal thickness two-component interference systems / I.V. Fekeshgazi, V.Yu. Pervak, Yu.A. Pervak // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2000. — Т. 3, № 3. — С. 371-378. — Бібліогр.: 20 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Summary: | The methods of synthesis and designing of the two-component unequal thickness multilayer interference systems as well as interconnection of their indices of layers are presented. A solution of the problem of suppressing high reflection zones at any harmonic frequency while maintaining high reflection at the operating frequency is proposed. The evolution of refractive zones at the inclined light incidence on the multilayer systems are studied. The results of the synthesis of antireflective coatings for some widely separated wavelengths are discussed. The application of results for the specific spectral characteristics and interference filters are proposed. |
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