Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures

The work deals with study and optimization of the technological parameters of ohmic contacts for HEMTs. It is shown that the depth of fusion front penetration into semiconductor is the main factor that determines ohmic properties of contact junctions.

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2002
Hauptverfasser: Konakova, R.V., Milenin, V.V., Stovpovoi, M.A.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2002
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121191
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures / R.V. Konakova, V.V. Milenin, M.A. Stovpovoi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 2. — С. 180-182. — Бібліогр.: 9 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121191
record_format dspace
spelling Konakova, R.V.
Milenin, V.V.
Stovpovoi, M.A.
2017-06-13T16:43:48Z
2017-06-13T16:43:48Z
2002
Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures / R.V. Konakova, V.V. Milenin, M.A. Stovpovoi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 2. — С. 180-182. — Бібліогр.: 9 назв. — англ.
1560-8034
PACS: 73.40.K, 73.40.C
https://nasplib.isofts.kiev.ua/handle/123456789/121191
The work deals with study and optimization of the technological parameters of ohmic contacts for HEMTs. It is shown that the depth of fusion front penetration into semiconductor is the main factor that determines ohmic properties of contact junctions.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures
spellingShingle Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures
Konakova, R.V.
Milenin, V.V.
Stovpovoi, M.A.
title_short Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures
title_full Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures
title_fullStr Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures
title_full_unstemmed Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures
title_sort optimization of technological parameters of ohmic contact junctions for gaas-algaas-based transistor structures
author Konakova, R.V.
Milenin, V.V.
Stovpovoi, M.A.
author_facet Konakova, R.V.
Milenin, V.V.
Stovpovoi, M.A.
publishDate 2002
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description The work deals with study and optimization of the technological parameters of ohmic contacts for HEMTs. It is shown that the depth of fusion front penetration into semiconductor is the main factor that determines ohmic properties of contact junctions.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121191
citation_txt Optimization of technological parameters of ohmic contact junctions for GaAs-AlGaAs-based transistor structures / R.V. Konakova, V.V. Milenin, M.A. Stovpovoi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 2. — С. 180-182. — Бібліогр.: 9 назв. — англ.
work_keys_str_mv AT konakovarv optimizationoftechnologicalparametersofohmiccontactjunctionsforgaasalgaasbasedtransistorstructures
AT mileninvv optimizationoftechnologicalparametersofohmiccontactjunctionsforgaasalgaasbasedtransistorstructures
AT stovpovoima optimizationoftechnologicalparametersofohmiccontactjunctionsforgaasalgaasbasedtransistorstructures
first_indexed 2025-12-07T13:10:01Z
last_indexed 2025-12-07T13:10:01Z
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