Kolyadina, E., Matveeva, L., Neluba, P., & Venger, E. (2015). Analysis of the fundamental absorption edge of the films obtained from the C₆₀ fullerene molecular beam in vacuum and effect of internal mechanical stresses on it. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago Style (17th ed.) CitationKolyadina, E.Yu, L.A Matveeva, P.L Neluba, and E.F Venger. "Analysis of the Fundamental Absorption Edge of the Films Obtained from the C₆₀ Fullerene Molecular Beam in Vacuum and Effect of Internal Mechanical Stresses on It." Semiconductor Physics Quantum Electronics & Optoelectronics 2015.
MLA (8th ed.) CitationKolyadina, E.Yu, et al. "Analysis of the Fundamental Absorption Edge of the Films Obtained from the C₆₀ Fullerene Molecular Beam in Vacuum and Effect of Internal Mechanical Stresses on It." Semiconductor Physics Quantum Electronics & Optoelectronics, 2015.