External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals

Influence of plastic deformation and high-temperature annealing (T = 2100 °C, t = 1 h) on SiC crystals with grown polytypic junctions demonstrating SF and DL spectra have been presented. SF-i and DL-i type luminescence are inherent to SiC crystals with distortions of the structure related with avail...

Повний опис

Збережено в:
Бібліографічні деталі
Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2015
Автори: Vlaskina, S.I., Mishinova, G.N., Vlaskin, V.I., Rodionov, V.E., Svechnikov, G.S.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/121273
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, V.E. Rodionov, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 4. — С. 448-451. — Бібліогр.: 28 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
_version_ 1862731546618757120
author Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
author_facet Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
citation_txt External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, V.E. Rodionov, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 4. — С. 448-451. — Бібліогр.: 28 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Influence of plastic deformation and high-temperature annealing (T = 2100 °C, t = 1 h) on SiC crystals with grown polytypic junctions demonstrating SF and DL spectra have been presented. SF-i and DL-i type luminescence are inherent to SiC crystals with distortions of the structure related with availability of packing defects that lead to onedimensional disordering (along the c-axis). They are a most expressed in doped crystals with original growth defects. DL luminescence appears in pure crystals at plastic deformation and in doped crystals at a hydrostatic pressure. It enhances at the high temperature annealing, too.
first_indexed 2025-12-07T19:26:34Z
format Article
fulltext
id nasplib_isofts_kiev_ua-123456789-121273
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T19:26:34Z
publishDate 2015
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
2017-06-13T18:58:56Z
2017-06-13T18:58:56Z
2015
External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals / S.I. Vlaskina, G.N. Mishinova, V.I. Vlaskin, V.E. Rodionov, G.S. Svechnikov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 4. — С. 448-451. — Бібліогр.: 28 назв. — англ.
1560-8034
DOI: 10.15407/spqeo18.04.448
PACS 64.70.K-, 77.84.Bw, 81.30.-t
https://nasplib.isofts.kiev.ua/handle/123456789/121273
Influence of plastic deformation and high-temperature annealing (T = 2100 °C, t = 1 h) on SiC crystals with grown polytypic junctions demonstrating SF and DL spectra have been presented. SF-i and DL-i type luminescence are inherent to SiC crystals with distortions of the structure related with availability of packing defects that lead to onedimensional disordering (along the c-axis). They are a most expressed in doped crystals with original growth defects. DL luminescence appears in pure crystals at plastic deformation and in doped crystals at a hydrostatic pressure. It enhances at the high temperature annealing, too.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
Article
published earlier
spellingShingle External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
Vlaskina, S.I.
Mishinova, G.N.
Vlaskin, V.I.
Rodionov, V.E.
Svechnikov, G.S.
title External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
title_full External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
title_fullStr External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
title_full_unstemmed External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
title_short External impacts on SiC nanostructures in pure and lightly doped silicon carbide crystals
title_sort external impacts on sic nanostructures in pure and lightly doped silicon carbide crystals
url https://nasplib.isofts.kiev.ua/handle/123456789/121273
work_keys_str_mv AT vlaskinasi externalimpactsonsicnanostructuresinpureandlightlydopedsiliconcarbidecrystals
AT mishinovagn externalimpactsonsicnanostructuresinpureandlightlydopedsiliconcarbidecrystals
AT vlaskinvi externalimpactsonsicnanostructuresinpureandlightlydopedsiliconcarbidecrystals
AT rodionovve externalimpactsonsicnanostructuresinpureandlightlydopedsiliconcarbidecrystals
AT svechnikovgs externalimpactsonsicnanostructuresinpureandlightlydopedsiliconcarbidecrystals