Modelling optical spectra and obtaining information on parameters and features of semiconductor structures
Problems of semiconductor optical spectrum identification are considered in the paper. Some models for description of optical reflection spectra in semiconductors and semiconductor structures are presented. Shown is the possibility to obtain information upon various parameters and characteristics of...
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| Veröffentlicht in: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Datum: | 2002 |
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| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2002
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/121299 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Modelling optical spectra and obtaining information on parameters and features of semiconductor structures / V.A. Vasiljev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 3. — С. 288-293. — Бібліогр.: 13 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-121299 |
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Vasiljev, V.A. 2017-06-13T20:39:57Z 2017-06-13T20:39:57Z 2002 Modelling optical spectra and obtaining information on parameters and features of semiconductor structures / V.A. Vasiljev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 3. — С. 288-293. — Бібліогр.: 13 назв. — англ. 1560-8034 PACS: 78.30.-j https://nasplib.isofts.kiev.ua/handle/123456789/121299 Problems of semiconductor optical spectrum identification are considered in the paper. Some models for description of optical reflection spectra in semiconductors and semiconductor structures are presented. Shown is the possibility to obtain information upon various parameters and characteristics of semiconductors and their structures by fitting theoretical spectra to experimental data. The estimation of validity and accuracy of obtained information is given. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Modelling optical spectra and obtaining information on parameters and features of semiconductor structures Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Modelling optical spectra and obtaining information on parameters and features of semiconductor structures |
| spellingShingle |
Modelling optical spectra and obtaining information on parameters and features of semiconductor structures Vasiljev, V.A. |
| title_short |
Modelling optical spectra and obtaining information on parameters and features of semiconductor structures |
| title_full |
Modelling optical spectra and obtaining information on parameters and features of semiconductor structures |
| title_fullStr |
Modelling optical spectra and obtaining information on parameters and features of semiconductor structures |
| title_full_unstemmed |
Modelling optical spectra and obtaining information on parameters and features of semiconductor structures |
| title_sort |
modelling optical spectra and obtaining information on parameters and features of semiconductor structures |
| author |
Vasiljev, V.A. |
| author_facet |
Vasiljev, V.A. |
| publishDate |
2002 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
Problems of semiconductor optical spectrum identification are considered in the paper. Some models for description of optical reflection spectra in semiconductors and semiconductor structures are presented. Shown is the possibility to obtain information upon various parameters and characteristics of semiconductors and their structures by fitting theoretical spectra to experimental data. The estimation of validity and accuracy of obtained information is given.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/121299 |
| citation_txt |
Modelling optical spectra and obtaining information on parameters and features of semiconductor structures / V.A. Vasiljev // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 3. — С. 288-293. — Бібліогр.: 13 назв. — англ. |
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AT vasiljevva modellingopticalspectraandobtaininginformationonparametersandfeaturesofsemiconductorstructures |
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2025-12-07T20:53:03Z |
| last_indexed |
2025-12-07T20:53:03Z |
| _version_ |
1850884261918277632 |