Photoelectric properties of metal-porous silicon-silicon planar heterostructures

Dark and light I-V characteristics as well as spectral curves of planar Ni-porous silicon-p-Si-Ni heterostructures have been studied. It is shown that photogeneration in heterostructure occurs both in the region of thin porous silicon layer and p-Si base. Avalanche breakdown is observed in the heter...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2002
Автори: Brodovoi, A.V., Brodovoi, V.A., Skryshevskyi, V.A., Bunchuk, S.G., Khnorozok, L.M.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2002
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/121336
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Photoelectric properties of metal-porous silicon-silicon planar heterostructures / A.V. Brodovoi, V.A. Brodovoi, V.A. Skryshevskyi, S.G. Bunchuk, L.M. Khnorozok // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 4. — С. 395-397. — Бібліогр.: 14 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121336
record_format dspace
spelling Brodovoi, A.V.
Brodovoi, V.A.
Skryshevskyi, V.A.
Bunchuk, S.G.
Khnorozok, L.M.
2017-06-14T07:35:56Z
2017-06-14T07:35:56Z
2002
Photoelectric properties of metal-porous silicon-silicon planar heterostructures / A.V. Brodovoi, V.A. Brodovoi, V.A. Skryshevskyi, S.G. Bunchuk, L.M. Khnorozok // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 4. — С. 395-397. — Бібліогр.: 14 назв. — англ.
1560-8034
PACS: 79.60.Jv
https://nasplib.isofts.kiev.ua/handle/123456789/121336
Dark and light I-V characteristics as well as spectral curves of planar Ni-porous silicon-p-Si-Ni heterostructures have been studied. It is shown that photogeneration in heterostructure occurs both in the region of thin porous silicon layer and p-Si base. Avalanche breakdown is observed in the heterostructure at applied voltage biases V > 8-10 V and T = 77 K. The coefficient of multiplying at V = 11 V achieves 60 (dark) and 200 (light), which is close to that of silicon n+-p-i-p+ avalanche photodiodes.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Photoelectric properties of metal-porous silicon-silicon planar heterostructures
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Photoelectric properties of metal-porous silicon-silicon planar heterostructures
spellingShingle Photoelectric properties of metal-porous silicon-silicon planar heterostructures
Brodovoi, A.V.
Brodovoi, V.A.
Skryshevskyi, V.A.
Bunchuk, S.G.
Khnorozok, L.M.
title_short Photoelectric properties of metal-porous silicon-silicon planar heterostructures
title_full Photoelectric properties of metal-porous silicon-silicon planar heterostructures
title_fullStr Photoelectric properties of metal-porous silicon-silicon planar heterostructures
title_full_unstemmed Photoelectric properties of metal-porous silicon-silicon planar heterostructures
title_sort photoelectric properties of metal-porous silicon-silicon planar heterostructures
author Brodovoi, A.V.
Brodovoi, V.A.
Skryshevskyi, V.A.
Bunchuk, S.G.
Khnorozok, L.M.
author_facet Brodovoi, A.V.
Brodovoi, V.A.
Skryshevskyi, V.A.
Bunchuk, S.G.
Khnorozok, L.M.
publishDate 2002
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Dark and light I-V characteristics as well as spectral curves of planar Ni-porous silicon-p-Si-Ni heterostructures have been studied. It is shown that photogeneration in heterostructure occurs both in the region of thin porous silicon layer and p-Si base. Avalanche breakdown is observed in the heterostructure at applied voltage biases V > 8-10 V and T = 77 K. The coefficient of multiplying at V = 11 V achieves 60 (dark) and 200 (light), which is close to that of silicon n+-p-i-p+ avalanche photodiodes.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121336
citation_txt Photoelectric properties of metal-porous silicon-silicon planar heterostructures / A.V. Brodovoi, V.A. Brodovoi, V.A. Skryshevskyi, S.G. Bunchuk, L.M. Khnorozok // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 4. — С. 395-397. — Бібліогр.: 14 назв. — англ.
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first_indexed 2025-11-28T15:48:12Z
last_indexed 2025-11-28T15:48:12Z
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