Noise in HgCdTe LWIR arrays
Mercury cadmium telluride (MCT) hybrid arrays for long-wavelength infrared (LWIR) applications with n+-p-diodes and n-channel charged coupled devices (CCD) silicon readouts were designed, manufactured and tested. Performance of these arrays at T 80 K is considered. The measurements of noise and si...
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| Datum: | 2002 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2002
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| Schriftenreihe: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/121337 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Noise in HgCdTe LWIR arrays / F.F. Sizov, A.G. Golenkov, V.V. Zabudsky, V.P. Reva // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2002. — Т. 5, № 4. — С. 398-402. — Бібліогр.: 4 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Zusammenfassung: | Mercury cadmium telluride (MCT) hybrid arrays for long-wavelength infrared (LWIR) applications with n+-p-diodes and n-channel charged coupled devices (CCD) silicon readouts were designed, manufactured and tested. Performance of these arrays at T 80 K is considered.
The measurements of noise and signal-to-noise ratio (SNR) are the key issues to determine performance parameters to characterize IR-sensors. That puts certain requirements to the registration system and used methods of measuring signals. To find out and eliminate noise sources the spectral noise power of signals was analyzed. It allowed the possibility to implement actions for reducing of the registration system noise, and to define the software noise filters to be used. |
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