Bi nanolines characterization by linear optical methods

The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bi...

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Published in:Functional Materials
Date:2016
Main Authors: Buchenko, V.V., Goloborodko, A.A.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2016
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Online Access:https://nasplib.isofts.kiev.ua/handle/123456789/121381
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121381
record_format dspace
spelling Buchenko, V.V.
Goloborodko, A.A.
2017-06-14T08:20:30Z
2017-06-14T08:20:30Z
2016
Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ.
1027-5495
DOI: dx.doi.org/10.15407/fm23.03.387
https://nasplib.isofts.kiev.ua/handle/123456789/121381
The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bismuth coverage, whereas after nanolines formation the width of the optical band gap decreases. Features of the experimentally obtained reflectance anisotropy spectra and surface differential reflectance spectra concerned with changing of the silicon surface reconstruction from 2x1 to 1x1 with the increasing of the bismuth covering degree from 0.5 ML to 1 ML. The experimental study of reflectance anisotropy spectra and surface differential reflectance spectra of Bi nanolines shows that the bismuth atoms are still present on the surface of the substrate in small amount, but the optical properties of such structures are determined by Si dimers.
en
НТК «Інститут монокристалів» НАН України
Functional Materials
Characterization and properties
Bi nanolines characterization by linear optical methods
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Bi nanolines characterization by linear optical methods
spellingShingle Bi nanolines characterization by linear optical methods
Buchenko, V.V.
Goloborodko, A.A.
Characterization and properties
title_short Bi nanolines characterization by linear optical methods
title_full Bi nanolines characterization by linear optical methods
title_fullStr Bi nanolines characterization by linear optical methods
title_full_unstemmed Bi nanolines characterization by linear optical methods
title_sort bi nanolines characterization by linear optical methods
author Buchenko, V.V.
Goloborodko, A.A.
author_facet Buchenko, V.V.
Goloborodko, A.A.
topic Characterization and properties
topic_facet Characterization and properties
publishDate 2016
language English
container_title Functional Materials
publisher НТК «Інститут монокристалів» НАН України
format Article
description The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bismuth coverage, whereas after nanolines formation the width of the optical band gap decreases. Features of the experimentally obtained reflectance anisotropy spectra and surface differential reflectance spectra concerned with changing of the silicon surface reconstruction from 2x1 to 1x1 with the increasing of the bismuth covering degree from 0.5 ML to 1 ML. The experimental study of reflectance anisotropy spectra and surface differential reflectance spectra of Bi nanolines shows that the bismuth atoms are still present on the surface of the substrate in small amount, but the optical properties of such structures are determined by Si dimers.
issn 1027-5495
url https://nasplib.isofts.kiev.ua/handle/123456789/121381
citation_txt Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ.
work_keys_str_mv AT buchenkovv binanolinescharacterizationbylinearopticalmethods
AT goloborodkoaa binanolinescharacterizationbylinearopticalmethods
first_indexed 2025-12-07T20:03:13Z
last_indexed 2025-12-07T20:03:13Z
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