Bi nanolines characterization by linear optical methods
The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bi...
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| Veröffentlicht in: | Functional Materials |
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| Datum: | 2016 |
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | Englisch |
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НТК «Інститут монокристалів» НАН України
2016
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| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/121381 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862738395634073600 |
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| author | Buchenko, V.V. Goloborodko, A.A. |
| author_facet | Buchenko, V.V. Goloborodko, A.A. |
| citation_txt | Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ. |
| collection | DSpace DC |
| container_title | Functional Materials |
| description | The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bismuth coverage, whereas after nanolines formation the width of the optical band gap decreases. Features of the experimentally obtained reflectance anisotropy spectra and surface differential reflectance spectra concerned with changing of the silicon surface reconstruction from 2x1 to 1x1 with the increasing of the bismuth covering degree from 0.5 ML to 1 ML. The experimental study of reflectance anisotropy spectra and surface differential reflectance spectra of Bi nanolines shows that the bismuth atoms are still present on the surface of the substrate in small amount, but the optical properties of such structures are determined by Si dimers.
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| first_indexed | 2025-12-07T20:03:13Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-121381 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1027-5495 |
| language | English |
| last_indexed | 2025-12-07T20:03:13Z |
| publishDate | 2016 |
| publisher | НТК «Інститут монокристалів» НАН України |
| record_format | dspace |
| spelling | Buchenko, V.V. Goloborodko, A.A. 2017-06-14T08:20:30Z 2017-06-14T08:20:30Z 2016 Bi nanolines characterization by linear optical methods / V.V. Buchenko, A.A. Goloborodko // Functional Materials. — 2016. — Т. 23, № 3. — С. 387-393. — Бібліогр.: 46 назв. — англ. 1027-5495 DOI: dx.doi.org/10.15407/fm23.03.387 https://nasplib.isofts.kiev.ua/handle/123456789/121381 The present paper dedicated to experimental investigations of optical properties of Bi/Si(001) interfaces and Bi nanolines in a wide spectral range (1eV). The experimental study of optical absorption spectrum showed the widening of the optical band gap of Bi/Si(001) interfaces with increasing the bismuth coverage, whereas after nanolines formation the width of the optical band gap decreases. Features of the experimentally obtained reflectance anisotropy spectra and surface differential reflectance spectra concerned with changing of the silicon surface reconstruction from 2x1 to 1x1 with the increasing of the bismuth covering degree from 0.5 ML to 1 ML. The experimental study of reflectance anisotropy spectra and surface differential reflectance spectra of Bi nanolines shows that the bismuth atoms are still present on the surface of the substrate in small amount, but the optical properties of such structures are determined by Si dimers. en НТК «Інститут монокристалів» НАН України Functional Materials Characterization and properties Bi nanolines characterization by linear optical methods Article published earlier |
| spellingShingle | Bi nanolines characterization by linear optical methods Buchenko, V.V. Goloborodko, A.A. Characterization and properties |
| title | Bi nanolines characterization by linear optical methods |
| title_full | Bi nanolines characterization by linear optical methods |
| title_fullStr | Bi nanolines characterization by linear optical methods |
| title_full_unstemmed | Bi nanolines characterization by linear optical methods |
| title_short | Bi nanolines characterization by linear optical methods |
| title_sort | bi nanolines characterization by linear optical methods |
| topic | Characterization and properties |
| topic_facet | Characterization and properties |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/121381 |
| work_keys_str_mv | AT buchenkovv binanolinescharacterizationbylinearopticalmethods AT goloborodkoaa binanolinescharacterizationbylinearopticalmethods |