Micropatterning in bistable cholesteric device with Bragg's reflection

In this work, the method to form bistable patterning in a cholesteric cell with Bragg’s reflection in the visible spectral range is demonstrated. In order to reach this, we used a Si/SiO₂ structure in which a potential relief on SiO₂ surface is induced due to enrichment and depletion of required for...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2006
Hauptverfasser: Gritsenko, M.I., Kucheev, S.I., Lytvyn, P.M., Tishenko, V.G., Tkach, V.M., Yelshansky, V.B.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2006
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121435
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Micropatterning in bistable cholesteric device with Bragg's reflection / M.I. Gritsenko, S.I. Kucheev, P.M. Lytvyn, V.G. Tishenko, V.M. Tkach, V.B. Yelshansky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 61-64. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121435
record_format dspace
spelling Gritsenko, M.I.
Kucheev, S.I.
Lytvyn, P.M.
Tishenko, V.G.
Tkach, V.M.
Yelshansky, V.B.
2017-06-14T10:54:40Z
2017-06-14T10:54:40Z
2006
Micropatterning in bistable cholesteric device with Bragg's reflection / M.I. Gritsenko, S.I. Kucheev, P.M. Lytvyn, V.G. Tishenko, V.M. Tkach, V.B. Yelshansky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 61-64. — Бібліогр.: 14 назв. — англ.
1560-8034
PACS 42.79.Kr, 89.75 Kd
https://nasplib.isofts.kiev.ua/handle/123456789/121435
In this work, the method to form bistable patterning in a cholesteric cell with Bragg’s reflection in the visible spectral range is demonstrated. In order to reach this, we used a Si/SiO₂ structure in which a potential relief on SiO₂ surface is induced due to enrichment and depletion of required form areas of the silicon near-surface layer during external electric field action. The patterning of enrichment is determined by the positive charge embedded into SiO₂ film, which is formed by thermodiffusion of aluminum atoms.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Micropatterning in bistable cholesteric device with Bragg's reflection
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Micropatterning in bistable cholesteric device with Bragg's reflection
spellingShingle Micropatterning in bistable cholesteric device with Bragg's reflection
Gritsenko, M.I.
Kucheev, S.I.
Lytvyn, P.M.
Tishenko, V.G.
Tkach, V.M.
Yelshansky, V.B.
title_short Micropatterning in bistable cholesteric device with Bragg's reflection
title_full Micropatterning in bistable cholesteric device with Bragg's reflection
title_fullStr Micropatterning in bistable cholesteric device with Bragg's reflection
title_full_unstemmed Micropatterning in bistable cholesteric device with Bragg's reflection
title_sort micropatterning in bistable cholesteric device with bragg's reflection
author Gritsenko, M.I.
Kucheev, S.I.
Lytvyn, P.M.
Tishenko, V.G.
Tkach, V.M.
Yelshansky, V.B.
author_facet Gritsenko, M.I.
Kucheev, S.I.
Lytvyn, P.M.
Tishenko, V.G.
Tkach, V.M.
Yelshansky, V.B.
publishDate 2006
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description In this work, the method to form bistable patterning in a cholesteric cell with Bragg’s reflection in the visible spectral range is demonstrated. In order to reach this, we used a Si/SiO₂ structure in which a potential relief on SiO₂ surface is induced due to enrichment and depletion of required form areas of the silicon near-surface layer during external electric field action. The patterning of enrichment is determined by the positive charge embedded into SiO₂ film, which is formed by thermodiffusion of aluminum atoms.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121435
citation_txt Micropatterning in bistable cholesteric device with Bragg's reflection / M.I. Gritsenko, S.I. Kucheev, P.M. Lytvyn, V.G. Tishenko, V.M. Tkach, V.B. Yelshansky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 61-64. — Бібліогр.: 14 назв. — англ.
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first_indexed 2025-12-07T20:20:55Z
last_indexed 2025-12-07T20:20:55Z
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