Pekar, G., Singaevsky, А., & Singaevsky, А. (2016). Аutomated method for determining the etch pits density on crystallographic planes of large semiconductor crystals. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago Style (17th ed.) CitationPekar, G.S, А.А Singaevsky, and А.F Singaevsky. "Аutomated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals." Semiconductor Physics Quantum Electronics & Optoelectronics 2016.
MLA (8th ed.) CitationPekar, G.S, et al. "Аutomated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals." Semiconductor Physics Quantum Electronics & Optoelectronics, 2016.
Warning: These citations may not always be 100% accurate.