Pekar, G., Singaevsky, А., & Singaevsky, А. (2016). Аutomated method for determining the etch pits density on crystallographic planes of large semiconductor crystals. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Pekar, G.S, А.А Singaevsky, und А.F Singaevsky. "Аutomated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals." Semiconductor Physics Quantum Electronics & Optoelectronics 2016.
MLA-Zitierstil (8. Ausg.)Pekar, G.S, et al. "Аutomated Method for Determining the Etch Pits Density on Crystallographic Planes of Large Semiconductor Crystals." Semiconductor Physics Quantum Electronics & Optoelectronics, 2016.
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