Optical properties of graphene film growing on a thin copper layer
Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements. Angle-variable ellipsometry measurements were performed to analyze features of opti...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2016 |
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2016
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/121525 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Optical properties of graphene film growing on a thin copper layer / T.S. Rozouvan, L.V. Poperenko, V.G. Kravets, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 1. — С. 57-61. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862693212062220288 |
|---|---|
| author | Rozouvan, T.S. Poperenko, L.V. Kravets, V.G. Shaykevich, I.A. |
| author_facet | Rozouvan, T.S. Poperenko, L.V. Kravets, V.G. Shaykevich, I.A. |
| citation_txt | Optical properties of graphene film growing on a thin copper layer / T.S. Rozouvan, L.V. Poperenko, V.G. Kravets, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 1. — С. 57-61. — Бібліогр.: 13 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements. Angle-variable ellipsometry measurements were performed to analyze features of optical conductivity and dispersion of the complex refraction index. Significant enhancement of the absorption band in the graphene single layer with respect to the bulk graphite was observed due to interaction between excited localized surface plasmon at the surface of thin Cu layer and graphene’s electrons. Scanning tunneling microscopy measurements with atomic spatial resolution revealed vertical crystal lattice structure of the deposited graphene layer. The obtained results provide direct evidence of the strong influence of the growth conditions on electronic and optical behavior of graphene films.
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| first_indexed | 2025-12-07T16:19:58Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-121525 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T16:19:58Z |
| publishDate | 2016 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Rozouvan, T.S. Poperenko, L.V. Kravets, V.G. Shaykevich, I.A. 2017-06-14T15:18:43Z 2017-06-14T15:18:43Z 2016 Optical properties of graphene film growing on a thin copper layer / T.S. Rozouvan, L.V. Poperenko, V.G. Kravets, I.A. Shaykevich // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 1. — С. 57-61. — Бібліогр.: 13 назв. — англ. 1560-8034 DOI: 10.15407/spqeo19.01.057 PACS 61.48.Gh, 68.37.Ef, 68.65.Pq, 78.30.Am, 78.67.Wj https://nasplib.isofts.kiev.ua/handle/123456789/121525 Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements. Angle-variable ellipsometry measurements were performed to analyze features of optical conductivity and dispersion of the complex refraction index. Significant enhancement of the absorption band in the graphene single layer with respect to the bulk graphite was observed due to interaction between excited localized surface plasmon at the surface of thin Cu layer and graphene’s electrons. Scanning tunneling microscopy measurements with atomic spatial resolution revealed vertical crystal lattice structure of the deposited graphene layer. The obtained results provide direct evidence of the strong influence of the growth conditions on electronic and optical behavior of graphene films. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Optical properties of graphene film growing on a thin copper layer Article published earlier |
| spellingShingle | Optical properties of graphene film growing on a thin copper layer Rozouvan, T.S. Poperenko, L.V. Kravets, V.G. Shaykevich, I.A. |
| title | Optical properties of graphene film growing on a thin copper layer |
| title_full | Optical properties of graphene film growing on a thin copper layer |
| title_fullStr | Optical properties of graphene film growing on a thin copper layer |
| title_full_unstemmed | Optical properties of graphene film growing on a thin copper layer |
| title_short | Optical properties of graphene film growing on a thin copper layer |
| title_sort | optical properties of graphene film growing on a thin copper layer |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/121525 |
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