Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model

Some electronic, thermodynamical and mechanical properties of Si1-xGex solid solution with an arbitrary (atomic) concentration (x) are studied using the pseudo-alloy atom model. This work is based on the pseudopotential theory of covalent crystals and on the higher-order perturbation scheme with the...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2005
Hauptverfasser: Jivani, A.R., Trivedi, H.J., Gajjar, P.N., Jani, A.R.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2005
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121544
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model / A.R. Jivani, H.J. Trivedi, P.N. Gajjar, A.R. Jani // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 14-17. — Бібліогр.: 21 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121544
record_format dspace
spelling Jivani, A.R.
Trivedi, H.J.
Gajjar, P.N.
Jani, A.R.
2017-06-14T16:07:52Z
2017-06-14T16:07:52Z
2005
Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model / A.R. Jivani, H.J. Trivedi, P.N. Gajjar, A.R. Jani // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 14-17. — Бібліогр.: 21 назв. — англ.
1560-8034
PACS 62.20.Dc, 71.15.Dx, 71.15H, 71.25T, 71.45N
https://nasplib.isofts.kiev.ua/handle/123456789/121544
Some electronic, thermodynamical and mechanical properties of Si1-xGex solid solution with an arbitrary (atomic) concentration (x) are studied using the pseudo-alloy atom model. This work is based on the pseudopotential theory of covalent crystals and on the higher-order perturbation scheme with the application of our proposed model potential. We have used the latest local field correction function proposed by Sarkar et al. alongwith other four local-field correction functions of Hartree, Taylor, Utsumi et al. and Farid et al. to study Si-Ge system. The total energy of the Si1-xGex solid solutions is investigated and compared with available experimental data. The calculated numerical values of the heat of solution for Si-Ge system are small and positive. The positive sign of the heat of solution predicts that, at low temperatures, the phase mixture will be more stable than the disordered solid solution. Like the case of simple metals, it is seen that a graph of the ratio of the heat of formations and x(1−x) against x is linear. The bulk modulus of Si1-xGex is also investigated with different concentrations x of Ge. We have found in the present study that the bulk modulus decreases linearly with an increase in the concentration x.
We acknowledge the financial support of University Grand Commission, New Delhi.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model
spellingShingle Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model
Jivani, A.R.
Trivedi, H.J.
Gajjar, P.N.
Jani, A.R.
title_short Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model
title_full Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model
title_fullStr Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model
title_full_unstemmed Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model
title_sort some physical properties of si₁₋xgex solid solutions using pseudo-alloy atom model
author Jivani, A.R.
Trivedi, H.J.
Gajjar, P.N.
Jani, A.R.
author_facet Jivani, A.R.
Trivedi, H.J.
Gajjar, P.N.
Jani, A.R.
publishDate 2005
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Some electronic, thermodynamical and mechanical properties of Si1-xGex solid solution with an arbitrary (atomic) concentration (x) are studied using the pseudo-alloy atom model. This work is based on the pseudopotential theory of covalent crystals and on the higher-order perturbation scheme with the application of our proposed model potential. We have used the latest local field correction function proposed by Sarkar et al. alongwith other four local-field correction functions of Hartree, Taylor, Utsumi et al. and Farid et al. to study Si-Ge system. The total energy of the Si1-xGex solid solutions is investigated and compared with available experimental data. The calculated numerical values of the heat of solution for Si-Ge system are small and positive. The positive sign of the heat of solution predicts that, at low temperatures, the phase mixture will be more stable than the disordered solid solution. Like the case of simple metals, it is seen that a graph of the ratio of the heat of formations and x(1−x) against x is linear. The bulk modulus of Si1-xGex is also investigated with different concentrations x of Ge. We have found in the present study that the bulk modulus decreases linearly with an increase in the concentration x.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121544
citation_txt Some physical properties of Si₁₋xGex solid solutions using pseudo-alloy atom model / A.R. Jivani, H.J. Trivedi, P.N. Gajjar, A.R. Jani // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 14-17. — Бібліогр.: 21 назв. — англ.
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