Investigation of cadmium telluride films on silicon substrate
Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index of cadmium telluride films on a silicon substrate was considerably less than tha...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2005 |
| Автори: | , , , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2005
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/121545 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Investigation of cadmium telluride films on silicon substrate / V.A. Odarych, A.Z. Sarsembaeva, F.F. Sizov, M.V. Vuichyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 55-59. — Бібліогр.: 7 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862566087576518656 |
|---|---|
| author | Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. |
| author_facet | Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. |
| citation_txt | Investigation of cadmium telluride films on silicon substrate / V.A. Odarych, A.Z. Sarsembaeva, F.F. Sizov, M.V. Vuichyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 55-59. — Бібліогр.: 7 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index of cadmium telluride films on a silicon substrate was considerably less than that of monocrystalline CdTe and depends on the film thickness, increasing with the thickness growth.
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| first_indexed | 2025-11-26T00:08:27Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-121545 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-11-26T00:08:27Z |
| publishDate | 2005 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. 2017-06-14T16:10:13Z 2017-06-14T16:10:13Z 2005 Investigation of cadmium telluride films on silicon substrate / V.A. Odarych, A.Z. Sarsembaeva, F.F. Sizov, M.V. Vuichyk // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 4. — С. 55-59. — Бібліогр.: 7 назв. — англ. 1560-8034 PACS 68.35.-p, 73.20.-r https://nasplib.isofts.kiev.ua/handle/123456789/121545 Properties of cadmium telluride films on silicon substrate, distribution of thickness and refraction index over the sample area were investigated by the ellipsometric method. It was ascertained that the refraction index of cadmium telluride films on a silicon substrate was considerably less than that of monocrystalline CdTe and depends on the film thickness, increasing with the thickness growth. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Investigation of cadmium telluride films on silicon substrate Article published earlier |
| spellingShingle | Investigation of cadmium telluride films on silicon substrate Odarych, V.A. Sarsembaeva, A.Z. Sizov, F.F. Vuichyk, M.V. |
| title | Investigation of cadmium telluride films on silicon substrate |
| title_full | Investigation of cadmium telluride films on silicon substrate |
| title_fullStr | Investigation of cadmium telluride films on silicon substrate |
| title_full_unstemmed | Investigation of cadmium telluride films on silicon substrate |
| title_short | Investigation of cadmium telluride films on silicon substrate |
| title_sort | investigation of cadmium telluride films on silicon substrate |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/121545 |
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