Precise measurements of the wavelength in KrCl laser spectral region (222 nm)

• Date: 2016
• Main Authors: Zubrilin, N.G., Pavlov, I.A., Baschenko, S.M., Tkachenko, O.M.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
• Series: Semiconductor Physics Quantum Electronics & Optoelectronics
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/121561
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Precise measurements of the wavelength in KrCl laser spectral region (222 nm) / N.G. Zubrilin, I.A. Pavlov, S.M. Baschenko, O.M. Tkachenko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 2. — С. 188-191. — Бібліогр.: 7 назв. — англ.

The technique for precise measurements of wavelengths in the range around 222 nm (45030 cm⁻¹) has been presented. The reciprocal linear dispersion of the spectrometer was 0.529 Å/mm. The measurements were made in the second spectral order for a grating with 2400 lines/mm. Identification of emission...