Degradation processes in LED modules

Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before...

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Опубліковано в: :Semiconductor Physics Quantum Electronics & Optoelectronics
Дата:2016
Автори: Sorokin, V.M., Kudryk, Ya.Ya., Shynkarenko, V.V., Kudryk, R.Ya., Sai, P.O.
Формат: Стаття
Мова:Англійська
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
Онлайн доступ:https://nasplib.isofts.kiev.ua/handle/123456789/121585
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Sorokin, V.M.
Kudryk, Ya.Ya.
Shynkarenko, V.V.
Kudryk, R.Ya.
Sai, P.O.
author_facet Sorokin, V.M.
Kudryk, Ya.Ya.
Shynkarenko, V.V.
Kudryk, R.Ya.
Sai, P.O.
citation_txt Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%.
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language English
last_indexed 2025-12-07T18:38:17Z
publishDate 2016
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Sorokin, V.M.
Kudryk, Ya.Ya.
Shynkarenko, V.V.
Kudryk, R.Ya.
Sai, P.O.
2017-06-14T17:19:46Z
2017-06-14T17:19:46Z
2016
Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ.
1560-8034
DOI: 10.15407/spqeo19.03.248
PACS 44.05.+e, 02.70.Rr, 42.72.-g
https://nasplib.isofts.kiev.ua/handle/123456789/121585
Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Degradation processes in LED modules
Article
published earlier
spellingShingle Degradation processes in LED modules
Sorokin, V.M.
Kudryk, Ya.Ya.
Shynkarenko, V.V.
Kudryk, R.Ya.
Sai, P.O.
title Degradation processes in LED modules
title_full Degradation processes in LED modules
title_fullStr Degradation processes in LED modules
title_full_unstemmed Degradation processes in LED modules
title_short Degradation processes in LED modules
title_sort degradation processes in led modules
url https://nasplib.isofts.kiev.ua/handle/123456789/121585
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AT kudrykyaya degradationprocessesinledmodules
AT shynkarenkovv degradationprocessesinledmodules
AT kudrykrya degradationprocessesinledmodules
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