Degradation processes in LED modules
Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2016 |
| Автори: | , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2016
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/121585 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
nasplib_isofts_kiev_ua-123456789-121585 |
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dspace |
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Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. 2017-06-14T17:19:46Z 2017-06-14T17:19:46Z 2016 Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ. 1560-8034 DOI: 10.15407/spqeo19.03.248 PACS 44.05.+e, 02.70.Rr, 42.72.-g https://nasplib.isofts.kiev.ua/handle/123456789/121585 Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Degradation processes in LED modules Article published earlier |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| title |
Degradation processes in LED modules |
| spellingShingle |
Degradation processes in LED modules Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. |
| title_short |
Degradation processes in LED modules |
| title_full |
Degradation processes in LED modules |
| title_fullStr |
Degradation processes in LED modules |
| title_full_unstemmed |
Degradation processes in LED modules |
| title_sort |
degradation processes in led modules |
| author |
Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. |
| author_facet |
Sorokin, V.M. Kudryk, Ya.Ya. Shynkarenko, V.V. Kudryk, R.Ya. Sai, P.O. |
| publishDate |
2016 |
| language |
English |
| container_title |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| format |
Article |
| description |
Electrical-heat-light degradation model of a light-emitting module has been developed in this work. The Monte-Carlo method was used to calculate the reliability time of LED modules with different halfwidth of LED chip series resistance. Separation of LED chips with different series resistance before assembling may increase the time of emission in a stable mode up to 10%.
|
| issn |
1560-8034 |
| url |
https://nasplib.isofts.kiev.ua/handle/123456789/121585 |
| citation_txt |
Degradation processes in LED modules / V.M. Sorokin, Ya.Ya. Kudryk, V.V. Shynkarenko, R.Ya. Kudryk, P.O. Sai // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 248-254. — Бібліогр.: 5 назв. — англ. |
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2025-12-07T18:38:17Z |
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