Transducer based on surface plasmon resonance with thermal modification of metal layer properties

• Published in: Semiconductor Physics Quantum Electronics & Optoelectronics
• Date: 2016
• Main Author: Kostiukevych, K.V.
• Format: Article
• Language: English
• Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
• Online Access: https://nasplib.isofts.kiev.ua/handle/123456789/121586
• Journal Title: Digital Library of Periodicals of National Academy of Sciences of Ukraine
• Cite this: Transducer based on surface plasmon resonance with thermal modification of metal layer properties / K.V. Kostiukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 255-266. — Бібліогр.: 36 назв. — англ.

With the purpose to improve such service characteristics of transducers on the basis of the surface plasmon resonance (SPR) as the sensitivity and stability, we have analyzed the influences of a structure and a relief of the surface of polycrystalline gold films, which are determined by technological conditions of their production and by the low-temperature annealing, on their optical characteristics, namely, the coefficients of refraction, extinction, and light scattering. It is shown that the mechanism of enhancement of the sensitivity of an SPR-based transducer consists in a decrease in the coefficient of extinction of a metal film, as the annealing temperature increases. At the optimum annealing temperature (120°C), we observed the smoothing of a small-scale roughness of the gold film surface, which decreases the scattering of plasmons, favors the defectless formation of protective nano-sized layers, and enhances the sensitivity and stability of the operation of SPR-based transducers.