Transducer based on surface plasmon resonance with thermal modification of metal layer properties
With the purpose to improve such service characteristics of transducers on the basis of the surface plasmon resonance (SPR) as the sensitivity and stability, we have analyzed the influences of a structure and a relief of the surface of polycrystalline gold films, which are determined by technologica...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2016 |
| Автор: | |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2016
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/121586 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Transducer based on surface plasmon resonance with thermal modification of metal layer properties / K.V. Kostiukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 255-266. — Бібліогр.: 36 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862720236183093248 |
|---|---|
| author | Kostiukevych, K.V. |
| author_facet | Kostiukevych, K.V. |
| citation_txt | Transducer based on surface plasmon resonance with thermal modification of metal layer properties / K.V. Kostiukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 255-266. — Бібліогр.: 36 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | With the purpose to improve such service characteristics of transducers on the basis of the surface plasmon resonance (SPR) as the sensitivity and stability, we have analyzed the influences of a structure and a relief of the surface of polycrystalline gold films, which are determined by technological conditions of their production and by the low-temperature annealing, on their optical characteristics, namely, the coefficients of refraction, extinction, and light scattering. It is shown that the mechanism of enhancement of the sensitivity of an SPR-based transducer consists in a decrease in the coefficient of extinction of a metal film, as the annealing temperature increases. At the optimum annealing temperature (120°C), we observed the smoothing of a small-scale roughness of the gold film surface, which decreases the scattering of plasmons, favors the defectless formation of protective nano-sized layers, and enhances the sensitivity and stability of the operation of SPR-based transducers.
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| first_indexed | 2025-12-07T18:24:41Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-121586 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-07T18:24:41Z |
| publishDate | 2016 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Kostiukevych, K.V. 2017-06-14T17:20:31Z 2017-06-14T17:20:31Z 2016 Transducer based on surface plasmon resonance with thermal modification of metal layer properties / K.V. Kostiukevych // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 255-266. — Бібліогр.: 36 назв. — англ. 1560-8034 DOI: 10.15407/spqeo19.03.255 PACS 73.20.Mf, 78.20.-e https://nasplib.isofts.kiev.ua/handle/123456789/121586 With the purpose to improve such service characteristics of transducers on the basis of the surface plasmon resonance (SPR) as the sensitivity and stability, we have analyzed the influences of a structure and a relief of the surface of polycrystalline gold films, which are determined by technological conditions of their production and by the low-temperature annealing, on their optical characteristics, namely, the coefficients of refraction, extinction, and light scattering. It is shown that the mechanism of enhancement of the sensitivity of an SPR-based transducer consists in a decrease in the coefficient of extinction of a metal film, as the annealing temperature increases. At the optimum annealing temperature (120°C), we observed the smoothing of a small-scale roughness of the gold film surface, which decreases the scattering of plasmons, favors the defectless formation of protective nano-sized layers, and enhances the sensitivity and stability of the operation of SPR-based transducers. This research was performed in the framework of state project No. 0112U002349 “Physical and technological aspects of development of modern semiconductor materials and functional structures for nano- and optoelectronics”, approved Nov. 28, 2011, supported by National Academy of Sciences of Ukraine en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Transducer based on surface plasmon resonance with thermal modification of metal layer properties Article published earlier |
| spellingShingle | Transducer based on surface plasmon resonance with thermal modification of metal layer properties Kostiukevych, K.V. |
| title | Transducer based on surface plasmon resonance with thermal modification of metal layer properties |
| title_full | Transducer based on surface plasmon resonance with thermal modification of metal layer properties |
| title_fullStr | Transducer based on surface plasmon resonance with thermal modification of metal layer properties |
| title_full_unstemmed | Transducer based on surface plasmon resonance with thermal modification of metal layer properties |
| title_short | Transducer based on surface plasmon resonance with thermal modification of metal layer properties |
| title_sort | transducer based on surface plasmon resonance with thermal modification of metal layer properties |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/121586 |
| work_keys_str_mv | AT kostiukevychkv transducerbasedonsurfaceplasmonresonancewiththermalmodificationofmetallayerproperties |