Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect

In the framework of the one-dimension field model of semiconductor simultaneosly subjected to the action of carrier-warming electric field and two quasi-monochromatic light waves the authors have numerically calculated the spatial-temporal distributions of inner electric field Е(x,τ) and conductivit...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2006
Hauptverfasser: Gorley, P.M., Horley, P.P., Chupyra, S.M.
Format: Artikel
Sprache:Englisch
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2006
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121587
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Zitieren:Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect / P.M. Gorley, P.P. Horley, S.M. Chupyra // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 1. — С. 93-96. — Бібліогр.: 8 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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author Gorley, P.M.
Horley, P.P.
Chupyra, S.M.
author_facet Gorley, P.M.
Horley, P.P.
Chupyra, S.M.
citation_txt Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect / P.M. Gorley, P.P. Horley, S.M. Chupyra // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 1. — С. 93-96. — Бібліогр.: 8 назв. — англ.
collection DSpace DC
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
description In the framework of the one-dimension field model of semiconductor simultaneosly subjected to the action of carrier-warming electric field and two quasi-monochromatic light waves the authors have numerically calculated the spatial-temporal distributions of inner electric field Е(x,τ) and conductivity band electrons n(x,τ) in dependence on external control parameters (intensity of the incident light waves, their wave vector, external electric field and doping impurity concentration). It was found that the device operating on the base of photorefractive Gunn effect may be controllably switched between three following operation modes: low- and high-light wave intensity as well as a transition mode. The influence of the external control parameters on the Е(x,τ) distribution was determined for each mode in question. It was shown that one could efficiently control the refractive index increment nΔ by means of proper change of the control parameters.
first_indexed 2025-12-07T20:16:43Z
format Article
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id nasplib_isofts_kiev_ua-123456789-121587
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
issn 1560-8034
language English
last_indexed 2025-12-07T20:16:43Z
publishDate 2006
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
record_format dspace
spelling Gorley, P.M.
Horley, P.P.
Chupyra, S.M.
2017-06-14T17:21:41Z
2017-06-14T17:21:41Z
2006
Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect / P.M. Gorley, P.P. Horley, S.M. Chupyra // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 1. — С. 93-96. — Бібліогр.: 8 назв. — англ.
1560-8034
PACS 85.30.Fg, 42.70.Nq, 42.65.Sf
https://nasplib.isofts.kiev.ua/handle/123456789/121587
In the framework of the one-dimension field model of semiconductor simultaneosly subjected to the action of carrier-warming electric field and two quasi-monochromatic light waves the authors have numerically calculated the spatial-temporal distributions of inner electric field Е(x,τ) and conductivity band electrons n(x,τ) in dependence on external control parameters (intensity of the incident light waves, their wave vector, external electric field and doping impurity concentration). It was found that the device operating on the base of photorefractive Gunn effect may be controllably switched between three following operation modes: low- and high-light wave intensity as well as a transition mode. The influence of the external control parameters on the Е(x,τ) distribution was determined for each mode in question. It was shown that one could efficiently control the refractive index increment nΔ by means of proper change of the control parameters.
This investigation was performed in the framework
 of the research project GP/F11/0036 (Grant of the
 President of Ukraine for the support of research work of
 young scientists, 2006).
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect
Article
published earlier
spellingShingle Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect
Gorley, P.M.
Horley, P.P.
Chupyra, S.M.
title Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect
title_full Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect
title_fullStr Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect
title_full_unstemmed Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect
title_short Electric field and carrier concentration distributions in the semiconductor under photorefractive Gunn effect
title_sort electric field and carrier concentration distributions in the semiconductor under photorefractive gunn effect
url https://nasplib.isofts.kiev.ua/handle/123456789/121587
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AT horleypp electricfieldandcarrierconcentrationdistributionsinthesemiconductorunderphotorefractivegunneffect
AT chupyrasm electricfieldandcarrierconcentrationdistributionsinthesemiconductorunderphotorefractivegunneffect