An analytical accumulation mode SOI pMOSFET model for high-temperature analog applications
An accumulation mode SOI pMOSFET model for simulation of analog circuits meant for high-temperature applications is presented in the paper. The model is based on explicit expressions for the drain current with an infinite order of continuity what assures smooth transitions between different operatio...
Gespeichert in:
| Datum: | 2006 |
|---|---|
| Hauptverfasser: | Houk, Yu., Iniguez, B., Flandre, D., Nazarov, A. |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2006
|
| Schriftenreihe: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Zugang: | https://nasplib.isofts.kiev.ua/handle/123456789/121592 |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | An analytical accumulation mode SOI pMOSFET model for high-temperature analog applications / Yu. Houk, B. Iniguez, D. Flandre, A. Nazarov // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 1. — С. 43-54. — Бібліогр.: 15 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of UkraineÄhnliche Einträge
-
An analytical accumulation mode SOI pMOSFET model for high-temperature analog applications
von: Houk, Yu., et al.
Veröffentlicht: (2006) -
Characterization of charge trapping processes in fully-depleted UNIBOND SOI MOSFET subjected to γ-irradiation
von: Houk, Y., et al.
Veröffentlicht: (2006) -
High-temperature characteristics of zone-melting recrystallized silicon-on-insulator MOSFETs
von: Lysenko, V.S., et al.
Veröffentlicht: (1998) -
Signal sampling with analog accumulation
von: V. P. Ruban, et al.
Veröffentlicht: (2014) -
Revision of interface coupling in ultra-thin body silicon-on-insulator MOSFETs
von: T. Rudenko, et al.
Veröffentlicht: (2013)