APA (7th ed.) Citation

Odarych, V., Sarsembaeva, A., Vuichyk, M., & Sizov, F. (2006). Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry. Semiconductor Physics Quantum Electronics & Optoelectronics.

Chicago Style (17th ed.) Citation

Odarych, V.A, A.Z Sarsembaeva, M.V Vuichyk, and F.F Sizov. "Determination of Parameters of Cadmium Telluride Films on Silicon by the Methods of Main Angle and Multiangular Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.

MLA (8th ed.) Citation

Odarych, V.A, et al. "Determination of Parameters of Cadmium Telluride Films on Silicon by the Methods of Main Angle and Multiangular Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.

Warning: These citations may not always be 100% accurate.