Odarych, V., Sarsembaeva, A., Vuichyk, M., & Sizov, F. (2006). Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Odarych, V.A, A.Z Sarsembaeva, M.V Vuichyk, und F.F Sizov. "Determination of Parameters of Cadmium Telluride Films on Silicon by the Methods of Main Angle and Multiangular Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.
MLA-Zitierstil (8. Ausg.)Odarych, V.A, et al. "Determination of Parameters of Cadmium Telluride Films on Silicon by the Methods of Main Angle and Multiangular Ellipsometry." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.