Denbnovetsky, S., & Slobodyan, N. (2006). Simulation of radiation characteristics of pulse X-ray devices for non-destructive testing the semiconductor materials. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago-Zitierstil (17. Ausg.)Denbnovetsky, S.V, und N.V Slobodyan. "Simulation of Radiation Characteristics of Pulse X-ray Devices for Non-destructive Testing the Semiconductor Materials." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.
MLA-Zitierstil (8. Ausg.)Denbnovetsky, S.V, und N.V Slobodyan. "Simulation of Radiation Characteristics of Pulse X-ray Devices for Non-destructive Testing the Semiconductor Materials." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.
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