Denbnovetsky, S., & Slobodyan, N. (2006). Simulation of radiation characteristics of pulse X-ray devices for non-destructive testing the semiconductor materials. Semiconductor Physics Quantum Electronics & Optoelectronics.
Chicago Style (17th ed.) CitationDenbnovetsky, S.V, and N.V Slobodyan. "Simulation of Radiation Characteristics of Pulse X-ray Devices for Non-destructive Testing the Semiconductor Materials." Semiconductor Physics Quantum Electronics & Optoelectronics 2006.
MLA (8th ed.) CitationDenbnovetsky, S.V, and N.V Slobodyan. "Simulation of Radiation Characteristics of Pulse X-ray Devices for Non-destructive Testing the Semiconductor Materials." Semiconductor Physics Quantum Electronics & Optoelectronics, 2006.
Warning: These citations may not always be 100% accurate.