Classic Ronchi test and its variants for quality control of various optical surfaces
Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of opera...
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| Опубліковано в: : | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Дата: | 2016 |
| Автори: | , |
| Формат: | Стаття |
| Мова: | Англійська |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2016
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| Онлайн доступ: | https://nasplib.isofts.kiev.ua/handle/123456789/121606 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Classic Ronchi test and its variants for quality control of various optical surfaces / A.S. Malenko, V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 311-314. — Бібліогр.: 13 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| _version_ | 1862659953671536640 |
|---|---|
| author | Malenko, A.S. Borovytsky, V.N. |
| author_facet | Malenko, A.S. Borovytsky, V.N. |
| citation_txt | Classic Ronchi test and its variants for quality control of various optical surfaces / A.S. Malenko, V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 311-314. — Бібліогр.: 13 назв. — англ. |
| collection | DSpace DC |
| container_title | Semiconductor Physics Quantum Electronics & Optoelectronics |
| description | Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of operation. Also, it is demonstrated interferential patterns for each method allowing one to determine which aberrations are present in the tested optics. With this method, when one can only visually detect aberrations, it seems to be not accurate. But with digital image processing the interferential pattern, special mathematical models and algorithms, aberrations that are present in the optical surface can be calculated with very high accuracy. Therefore, the methods of control offered in this paper provide fast and accurate results for the data circuits to be simply assembled and configured.
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| first_indexed | 2025-12-02T10:26:34Z |
| format | Article |
| fulltext | |
| id | nasplib_isofts_kiev_ua-123456789-121606 |
| institution | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| issn | 1560-8034 |
| language | English |
| last_indexed | 2025-12-02T10:26:34Z |
| publishDate | 2016 |
| publisher | Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| record_format | dspace |
| spelling | Malenko, A.S. Borovytsky, V.N. 2017-06-14T18:38:19Z 2017-06-14T18:38:19Z 2016 Classic Ronchi test and its variants for quality control of various optical surfaces / A.S. Malenko, V.N. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 3. — С. 311-314. — Бібліогр.: 13 назв. — англ. 1560-8034 DOI: 10.15407/spqeo19.03.311 PACS 42.15.Fr https://nasplib.isofts.kiev.ua/handle/123456789/121606 Performed in this work is the analysis of the optical Ronchi interferometer circuit and its upgrading to test quality of various optical surfaces. Briefly described in this paper is the classic test by Ronchi, shown is every upgraded circuit diagram of the interferometer and their principle of operation. Also, it is demonstrated interferential patterns for each method allowing one to determine which aberrations are present in the tested optics. With this method, when one can only visually detect aberrations, it seems to be not accurate. But with digital image processing the interferential pattern, special mathematical models and algorithms, aberrations that are present in the optical surface can be calculated with very high accuracy. Therefore, the methods of control offered in this paper provide fast and accurate results for the data circuits to be simply assembled and configured. en Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України Semiconductor Physics Quantum Electronics & Optoelectronics Classic Ronchi test and its variants for quality control of various optical surfaces Article published earlier |
| spellingShingle | Classic Ronchi test and its variants for quality control of various optical surfaces Malenko, A.S. Borovytsky, V.N. |
| title | Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_full | Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_fullStr | Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_full_unstemmed | Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_short | Classic Ronchi test and its variants for quality control of various optical surfaces |
| title_sort | classic ronchi test and its variants for quality control of various optical surfaces |
| url | https://nasplib.isofts.kiev.ua/handle/123456789/121606 |
| work_keys_str_mv | AT malenkoas classicronchitestanditsvariantsforqualitycontrolofvariousopticalsurfaces AT borovytskyvn classicronchitestanditsvariantsforqualitycontrolofvariousopticalsurfaces |