Electromagnetic resonance absorption in metallic gratings

Reflection of electromagnetic waves with the 1.5 μm length from a metallic grating (silver) with rectangular groove profile was analyzed using the method of coupled waves. Appearance of the waveguide effect in a dielectric film and, accordingly, of electromagnetic field resonance is a necessary cond...

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Veröffentlicht in:Semiconductor Physics Quantum Electronics & Optoelectronics
Datum:2006
Hauptverfasser: Fitio, V.M., Laba, H.P., Bobitski, Y.V.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2006
Online Zugang:https://nasplib.isofts.kiev.ua/handle/123456789/121618
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Electromagnetic resonance absorption in metallic gratings / V.M. Fitio, H.P. Laba, Y.V. Bobitski // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 3. — С. 49-55. — Бібліогр.: 18 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id nasplib_isofts_kiev_ua-123456789-121618
record_format dspace
spelling Fitio, V.M.
Laba, H.P.
Bobitski, Y.V.
2017-06-15T03:07:51Z
2017-06-15T03:07:51Z
2006
Electromagnetic resonance absorption in metallic gratings / V.M. Fitio, H.P. Laba, Y.V. Bobitski // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 3. — С. 49-55. — Бібліогр.: 18 назв. — англ.
1560-8034
PACS 42.79.Dj, 42.25.Fx, 42.25.Bs
https://nasplib.isofts.kiev.ua/handle/123456789/121618
Reflection of electromagnetic waves with the 1.5 μm length from a metallic grating (silver) with rectangular groove profile was analyzed using the method of coupled waves. Appearance of the waveguide effect in a dielectric film and, accordingly, of electromagnetic field resonance is a necessary condition of resonance absorption at presence of dielectric thin film on the grating. The electromagnetic field resonance phenomenon confirms a dependence of reflection on the wavelength, which is described by the Lorenz function. When the film is absent, strong absorption is possible at appearance of the waveguide effect between both grating metallic vertical walls. Due to plasma resonance, both the waveguide effect and, accordingly, high absorption arise at any distance between metallic walls of grating (slot width) for TM polarized waves. For this polarization in the slot of 0.478 μm width filled with dielectric with permittivity 9ε = , the two waveguide modes propagate. That fact is confirmed by a dependence of reflection logarithm on the grating depth. For TE polarized waves in the slot of 0.378 μm width, the waveguide effect is possible on one mode only. The spectral dependence of reflection for TE polarized waves is well described by the Lorenz function, and due to excitation of two waveguide modes some deviation from this function is observed for TM polarized waves. The dependence of the reflection index on the grating depth completely agrees with the constant of waveguide mode propagation in the grating slot.
en
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
Semiconductor Physics Quantum Electronics & Optoelectronics
Electromagnetic resonance absorption in metallic gratings
Article
published earlier
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
title Electromagnetic resonance absorption in metallic gratings
spellingShingle Electromagnetic resonance absorption in metallic gratings
Fitio, V.M.
Laba, H.P.
Bobitski, Y.V.
title_short Electromagnetic resonance absorption in metallic gratings
title_full Electromagnetic resonance absorption in metallic gratings
title_fullStr Electromagnetic resonance absorption in metallic gratings
title_full_unstemmed Electromagnetic resonance absorption in metallic gratings
title_sort electromagnetic resonance absorption in metallic gratings
author Fitio, V.M.
Laba, H.P.
Bobitski, Y.V.
author_facet Fitio, V.M.
Laba, H.P.
Bobitski, Y.V.
publishDate 2006
language English
container_title Semiconductor Physics Quantum Electronics & Optoelectronics
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
format Article
description Reflection of electromagnetic waves with the 1.5 μm length from a metallic grating (silver) with rectangular groove profile was analyzed using the method of coupled waves. Appearance of the waveguide effect in a dielectric film and, accordingly, of electromagnetic field resonance is a necessary condition of resonance absorption at presence of dielectric thin film on the grating. The electromagnetic field resonance phenomenon confirms a dependence of reflection on the wavelength, which is described by the Lorenz function. When the film is absent, strong absorption is possible at appearance of the waveguide effect between both grating metallic vertical walls. Due to plasma resonance, both the waveguide effect and, accordingly, high absorption arise at any distance between metallic walls of grating (slot width) for TM polarized waves. For this polarization in the slot of 0.478 μm width filled with dielectric with permittivity 9ε = , the two waveguide modes propagate. That fact is confirmed by a dependence of reflection logarithm on the grating depth. For TE polarized waves in the slot of 0.378 μm width, the waveguide effect is possible on one mode only. The spectral dependence of reflection for TE polarized waves is well described by the Lorenz function, and due to excitation of two waveguide modes some deviation from this function is observed for TM polarized waves. The dependence of the reflection index on the grating depth completely agrees with the constant of waveguide mode propagation in the grating slot.
issn 1560-8034
url https://nasplib.isofts.kiev.ua/handle/123456789/121618
citation_txt Electromagnetic resonance absorption in metallic gratings / V.M. Fitio, H.P. Laba, Y.V. Bobitski // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 3. — С. 49-55. — Бібліогр.: 18 назв. — англ.
work_keys_str_mv AT fitiovm electromagneticresonanceabsorptioninmetallicgratings
AT labahp electromagneticresonanceabsorptioninmetallicgratings
AT bobitskiyv electromagneticresonanceabsorptioninmetallicgratings
first_indexed 2025-12-07T16:43:24Z
last_indexed 2025-12-07T16:43:24Z
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